Titlebook: Applied Metallography; George F. Voort Book 1986 Van Nostrand Reinhold Company Inc. 1986 Titan.electron microscopy.material.metallurgy.met

affected

書目名稱Applied Metallography影響因子(影響力)




書目名稱Applied Metallography影響因子(影響力)學(xué)科排名




書目名稱Applied Metallography網(wǎng)絡(luò)公開度




書目名稱Applied Metallography網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Applied Metallography被引頻次




書目名稱Applied Metallography被引頻次學(xué)科排名




書目名稱Applied Metallography年度引用




書目名稱Applied Metallography年度引用學(xué)科排名




書目名稱Applied Metallography讀者反饋




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歌唱隊(duì)

Potentiostatic Etching,g held in a suitable etching electrolyte at a controlled potential. Independent control of potential is accomplished by potentiostats. These are instruments capable of holding the potential of a metal to prescribed values relative to a reference electrode placed in the environment solution. The sele

Frisky

crumble

Magnetic Etching,The atoms in most materials have electrons that are paired and spinning in opposite directions so that the net magnetism is cancelled. In some materials, however, there are atoms with one or more unpaired electrons, and these produce a net magnetic moment.

tolerance

The Gas Contrasting Method,inctions between the phases, crystallites, and boundaries of the polished section are based on their differential interaction behavior—reflection and absorption—with optical light rays in optical microscopy or with electron beams in electron microscopy. To obtain an image that can be analyzed micros

貴族

Optic-Disk

強(qiáng)制性

牢騷

The SEM as a Metallographic Tool,ere it is a rather common tool. Indeed, its use rivals that of the light optical microscope (LOM). This popularity stems from the substantial progress made by instrument manufacturers, the wide range of instruments available, and the many advantages of the SEM—ease of specimen preparation (compared

integrated

Metallography in the Scanning Transmission Electron Microscope, microscope (SEM) that has revolutionized the amount of information that can be obtained from a thin-foil TEM specimen. Figure 11–1(a) shows the range of signals generated when a high-energy (usually ~ 100 kV) electron beam interacts with a thin-foil specimen. Although all of these signals are theor