Titlebook: Application of Particle and Laser Beams in Materials Technology; P. Misaelides Book 1995 Springer Science+Business Media Dordrecht 1995 Va

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Book 1995 in Materials Technology", which was held in Kallithea, Chalkidiki, in Northern Greece, from the 8th to the 21st of May, 1994 and attended by 73 participants from 21 countries. The aim of this ASI was to provide to the participants an overview of this rapidly expanding field. Fundamental aspects con

Introduction

Graves’-disease

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Febrile Neutropenia: Management Issuesuctors by observing the surface-sensitive laser-induced photoluminescence from thin layers of InGaAs and GaAs ., during exposure of their surfaces to reactive gaseous species. We have observed the surface passivation to improve by as much as a factor of 6000 following an exposure of a few seconds to

Inflamed

Depth Profiling in Combination with Sputteringthe sample as well as on the bombardment parameters. Quite generally, the best depth resolution is achieved using low-energy primary ion beams and glancing angles of bombardment, but this is accomplished only at the expense of erosion rate and lateral resolution (due to reduced beam current and enla

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Optical Spectrometry Coupled with Laser Ablation for Analytical Applications on Solidss are discussed, each making use of a particular phase of the laser ablation process: in LA-OES, that is Optical Emission Spectroscopy, the direct emission of the produced plasma is analysed; in LA-LIF, transitions of the cooled atomic vapour are resonantly excited by a dye-laser; in LA-ICP-OES, the

Muscularis

Laser Beam Probes for Semiconductor Processinguctors by observing the surface-sensitive laser-induced photoluminescence from thin layers of InGaAs and GaAs ., during exposure of their surfaces to reactive gaseous species. We have observed the surface passivation to improve by as much as a factor of 6000 following an exposure of a few seconds to

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0168-132X y 73 participants from 21 countries. The aim of this ASI was to provide to the participants an overview of this rapidly expanding field. Fundamental aspects con978-90-481-4510-2978-94-015-8459-3Series ISSN 0168-132X

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