Titlebook: An Introduction to Logic Circuit Testing; Parag K. Lala Book 2009 Springer Nature Switzerland AG 2009

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Synthesis Lectures on Digital Circuits & Systemshttp://image.papertrans.cn/a/image/155321.jpg

Fracture

Menschenwürdig altern und sterbenly a single stuck-at fault is assumed to be present in the circuit under test, then the problem is to construct a test set that will detect the fault by utilizing only the inputs and the outputs of the circuit.

CULP

Das Altern von Knochen, Muskeln und Gelenkenng the chips themselves, the incorporation of the chips into systems has caused test generation’s cost to grow exponentially. A widely accepted approach to deal with the testing problem at the chip level is to incorporate built-in self-test (BIST) capability inside a chip. This increases the control

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親屬

尊重

Design for Testability,The phrase . refers to how a circuit is either designed or modified so that the testing of the circuit is simplified. Several techniques have been developed over the years for improving the testability of logic circuits. These can be categorized into two categories: . and

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