Titlebook: Ambient Intelligence with Microsystems; Augmented Materials Kieran Delaney Book 2008 Springer-Verlag US 2008 CompTIA RFID+.Internet of Thi

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https://doi.org/10.1007/978-3-322-92488-9liable. A proactive, integrated approach to reliability analysis and planning with a vision towards future applications is therefore essential if NES are to be accepted in the marketplace. As overall NES reliability is a distributed function across all layers of the protocol stack, each layer must l