Titlebook: Ageing of Integrated Circuits; Causes, Effects and Basel Halak Book 2020 Springer Nature Switzerland AG 2020 Analog IC Reliability.Aging E

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Critique and Its Postnational Aftermathents of digital circuits is crucial, in particular, in static random-access memory (SRAM) as it is always subject to ageing for whatever value is stored in an SRAM cell. Moreover, the prolonged storage of the same bit patterns in an SRAM can cause asymmetric NBTI stress, which is manifested by the t

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Philipp S. Müller,Markus Ledererand performance monitors have become necessary for adaptive compensation schemes. This chapter presents up-to-date state-of-the-art performance and reliability monitors, insertion methodology and experimental results of different monitors used for process and environment variations as well as ageing

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https://doi.org/10.1057/9781403979513o various aging mechanisms. Bias temperature instability (BTI) and hot carrier injection (HCI) phenomena are highly accused of the aging-related reliability reduction. This degradation is getting worse under excess stress conditions (high operating temperature and voltage levels). Aging phenomena si

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Gene Callahan,Kenneth B. McIntyreS device will degrade significantly over time and, therefore, results in the delay faults. In situ delay fault monitoring schemes have been proposed to ensure the reliability of an IC during its lifetime. Such schemes are usually based on the application of ageing sensors to predict ageing-induced f

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Basel HalakDescribes in detail the physical mechanisms of CMOS ageing.Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits.Presents state-of-the art s

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