| 期刊全稱 | Advanced Test Methods for SRAMs | | 期刊簡(jiǎn)稱 | Effective Solutions | | 影響因子2023 | Alberto Bosio,Luigi Dilillo,Arnaud Virazel | | 視頻video | http://file.papertrans.cn/147/146341/146341.mp4 | | 發(fā)行地址 | First book to present complete, state-of-the-art coverage of dynamic fault memory testing.Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation | | 圖書(shū)封面 |  | | 影響因子 | .Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.. | | Pindex | Book 2010 |
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