Titlebook: Advanced Mineralogy; Volume 1 Composition A. S. Marfunin Book 1994 Springer-Verlag Berlin Heidelberg 1994 Analytical Methods.Analytische Me

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Mahmud Tareq Hassan Khan,Arjumand Athers, such as dislocations, stacking faults, Wadsley defects, and antiphase boundaries. Modern electron microscopes, however, are capable of imaging individual, isolated atoms (e.g., Isaacson et al. 1979), raising the question of whether individual or clustered point defects can be resolved within mine

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Topics in Heterocyclic ChemistryEPR) as well as by optical spectroscopy. In many cases, it is convenient to classify these into two general types: missing-electron species and excess-electron species, as compared to some diamagnetic precursor. The concept of holes is useful when the number of electrons is insufficient to fill a gi

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Noboru Motohashi,Hiroshi Sakagami as in pegmatites or druses, may be highly perfect. X-ray topography is an imaging technique which is very sensitive to local strains and which is therefore applied to perfect or nearly perfect crystals. It enables one to visualize and to characterize defects such as dislocations, growth bands, grow

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Kohjiro Nagao,Naoto Juni,Masato UmedaWith a sufficient data base of melt structure in binary, ternary and quaternary systems, the principal structural features likely to exist in silicate melts in the bulk compositional range of natural igneous rocks can be identified.

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Advanced Mineralogyhttp://image.papertrans.cn/a/image/145987.jpg

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