Titlebook: Active Probe Atomic Force Microscopy; A Practical Guide on Fangzhou Xia,Ivo W. Rangelow,Kamal Youcef-Toumi Textbook 2024 The Editor(s) (if

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Synchronous Products of Rewrite Systemsing at micro-/nanoscale. Subsequently, the book’s scope, objectives, and chapter topics are outlined. The discussion centers around the operational principles and imaging capabilities of AFMs without going into specific implementation details. Fundamental aspects such as modes of operation, probe-sa

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Denis Kuperberg,Julien Brunel,David Chemouilmicroscopy (AFM) cantilever deflections. Initially, the mechanics of the cantilever, a critical component that links internal stress and strain with the deflection, are derived in detail. A combination of these mechanics and sensing principles, as elucidated in Chap. ., gives rise to principles that

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https://doi.org/10.1007/978-3-030-59152-6of the primary nanofabrication techniques, along with the corresponding enabling technologies, will be the starting point. The process principles, such as deposition, etching, patterning, and surface modification, are discussed, especially in the context of microcantilever nanofabrication. In additi

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On (,/,)-Aware Good-For-Games Automatas. Advanced nanofabrication techniques empower AFM probes with a variety of new capabilities to meet experimental needs. First, the modification of AFM probes on both the tip and the microcantilever are discussed for specialized imaging applications. Next, nanofabrication techniques to embed functio

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https://doi.org/10.1007/978-3-030-59152-6ovides a detailed presentation of nano-positioning system designs, starting with an overview of generic nano-positioners, flexures, fixtures, and actuators. In AFM imaging, coarse positioners with a millimeter range and fine scanners with hundreds of micrometer range and sub-nanometer resolution wor

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