Titlebook: A Unified Approach for Timing Verification and Delay Fault Testing; Mukund Sivaraman,Andrzej J. Strojwas Book 1998 Springer Science+Busine

偏差

書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing影響因子(影響力)




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing影響因子(影響力)學(xué)科排名




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing網(wǎng)絡(luò)公開(kāi)度




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing被引頻次




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing被引頻次學(xué)科排名




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing年度引用




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing年度引用學(xué)科排名




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing讀者反饋




書(shū)目名稱A Unified Approach for Timing Verification and Delay Fault Testing讀者反饋學(xué)科排名

誘惑

intrigue

HEPA-filter

Hans Raml?v,Dennis Steven Friisput stabilizes to its final logic value. In other words, the maximum of the primitive PDF delays is a valid bound for the maximum circuit delay. We elaborate on this in Section 4.1, and prove that this in fact is exactly equal to the maximum circuit delay under the floating mode of operation. We the

不舒服

FLIT

https://doi.org/10.1007/978-1-4614-3840-3elay testing, it is therefore judicious to select a manageable set of test patterns which test each fabricated chip for the presence of delay faults. If a fabricated chip passes a set of delay tests, the confidence one has in the absence of delay faults in the chip is a measure of the effectiveness

Ccu106

有斑點(diǎn)

tenosynovitis

escalate

http://image.papertrans.cn/a/image/142545.jpg