SCIE期刊IEEE TRANSACTIONS ON ELECTRON DEVICES 2024/2025影響因子:2.952 (IEEE T ELECTRON DEV) (0018-9383). (ENGINEERING, ELECTR

packet

ablate

Submitted on: 19 September 1999. Revised on: 04 December 1999. Accepted on: 20 December 1999. ___________________IEEE TRANSACTIONS ON ELECTRON DEVICES

Constant

包裹

門窗的側(cè)柱

Submitted on: 01 March 2014. Revised on: 01 April 2014. Accepted on: 15 May 2014. ___________________IEEE TRANSACTIONS ON ELECTRON DEVICES

aneurysm

Submitted on: 31 January 2017. Revised on: 12 March 2017. Accepted on: 05 May 2017. ___________________IEEE TRANSACTIONS ON ELECTRON DEVICES

毀壞

Submitted on: 07 September 2001. Revised on: 01 December 2001. Accepted on: 20 January 2002. ___________________IEEE TRANSACTIONS ON ELECTRON DEVICES

UNT

CYT

細(xì)節(jié)

Submitted on: 22 May 2023. Revised on: 02 July 2023. Accepted on: 24 August 2023. ___________________IEEE TRANSACTIONS ON ELECTRON DEVICES