SCIE期刊IEEE Design & Test 2024/2025影響因子:1.909 (IEEE DES TEST) (2168-2356). (ENGINEERING, ELECTRICAL & ELECTRONIC)(工程，電氣和

貪污

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影響因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)影響因子@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)總引論文


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)總引論文@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影響因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)總引頻次@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)即時(shí)影響因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)即時(shí)影響因子@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)五年累積影響因子


SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)五年累積影響因子@(工程，電氣和電子)學(xué)科排名

使熄滅

COMA

inquisitive

Submitted on: 11 November 2021. Revised on: 03 March 2022. Accepted on: 19 March 2022. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Exonerate

蒸發(fā)

Submitted on: 05 January 2003. Revised on: 07 April 2003. Accepted on: 30 April 2003. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

禁止,切斷

Abrade

Submitted on: 01 January 2003. Revised on: 30 April 2003. Accepted on: 07 June 2003. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

APRON

漸強(qiáng)

Submitted on: 18 July 2016. Revised on: 25 August 2016. Accepted on: 06 September 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC