Titlebook: Low-Power Variation-Tolerant Design in Nanometer Silicon; Swarup Bhunia,Saibal Mukhopadhyay Book 2011 Springer Science+Business Media, LLC

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Variations: Sources and Characterizationhe sources of process variation during manufacturing, followed by environmental variations during usage. Environmental variations include temperature, voltage fluctuations, and temporal variations. Finally, we discuss the state of art characterization circuits (or sensors) employed to understand the extent and impact of variations.

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Variations: Sources and Characterizationhe sources of process variation during manufacturing, followed by environmental variations during usage. Environmental variations include temperature, voltage fluctuations, and temporal variations. Finally, we discuss the state of art characterization circuits (or sensors) employed to understand the

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Effect of Variations and Variation Tolerance in Logic Circuitsr dimensions. This fluctuation in device geometries might prevent them from meeting timing and power criteria and degrade the parametric yield. Process limitations are not exhibited as physical disparities only; transistors experience temporal device degradation as well. On top of it, power manageme

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Variation-Tolerant Microprocessor Architecture at Low Powersign. An overview of the different sources of parameter variations is presented, and a discussion of the different models used at the architectural level to understand their effect on processor power and performance is provided. All sources of variations lead to timing overhead and uncertainty, but

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