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標題: Titlebook: System-level Test and Validation of Hardware/Software Systems; Matteo Sonza Reorda,Zebo Peng,Massimo Violante Book 2005 Springer-Verlag Lo [打印本頁]

作者: GURU    時間: 2025-3-21 18:22
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作者: Myocyte    時間: 2025-3-21 22:17
Test Generation: A Symbolic Approach,ymbolic ATPG is applied after a random-based ATPG, may represent a valuable solution to achieve a very high fault coverage keeping low the execution time. The testing methodology is implemented in a highly flexible functional verification framework that is based on a high-level fault model and a tes
作者: 情節(jié)劇    時間: 2025-3-22 01:20
1437-0387 ...modeling of bugs and defects;..stimulus generation for validation and test purposes (including timing errors;..design for testability..978-1-84996-953-6978-1-84628-145-7Series ISSN 1437-0387 Series E-ISSN 2197-6643
作者: 能得到    時間: 2025-3-22 07:31

作者: dissolution    時間: 2025-3-22 12:32

作者: 滲入    時間: 2025-3-22 16:05
J. P. Teixeiraer, .Software Exorcism. discusses tools and techniques for effective and aggressive debugging, gives optimization strategies that appeal to all levels of programmers, and presents in-depth treatments of technical issues with honest assessments that are not biased toward proprietary solutions. .978-1-4302-5423-2978-1-4302-0788-7
作者: placebo-effect    時間: 2025-3-22 20:58
G. Jervan,R. Ubar,Z. Peng,P. Elesportantly the concept of a near miss is discussed. The proposed NMS lies at the intersection of failure analysis, digital forensics and near-miss analysis. The NMS focusses on the detection and prioritisation of near misses at runtime, during the operations and maintenance phase of a software system
作者: aviator    時間: 2025-3-23 00:19
E. Sánchez,M. Sonza Reorda,G. Squillerohe aviation industry. Near-miss analysis when applied to software failure investigations can be challenging, especially with regard to the sheer volume of near misses. Much work has been performed to define a structured approach for near-miss analysis. One of the main components of such an approach
作者: 豐富    時間: 2025-3-23 04:00
I. G. Harrisrchase, and avoidance when risks are simply too high. Software failure risk assessment can provide the information to analyze functionality, financial, and project risks associated with failure due to faults in software. This information can modify the development process or suggest changes to syste
作者: 摻假    時間: 2025-3-23 07:58

作者: 輕快帶來危險    時間: 2025-3-23 10:48

作者: crescendo    時間: 2025-3-23 17:22
rchase, and avoidance when risks are simply too high. Software failure risk assessment can provide the information to analyze functionality, financial, and project risks associated with failure due to faults in software. This information can modify the development process or suggest changes to syste
作者: employor    時間: 2025-3-23 18:18
Book 2005-the-art overview of the current validation and test techniques by covering all aspects of the subject including:...modeling of bugs and defects;..stimulus generation for validation and test purposes (including timing errors;..design for testability..
作者: Obsequious    時間: 2025-3-23 22:30
Matteo Sonza Reorda,Zebo Peng,Massimo ViolanteThe reader will learn about the state of the art in system-level validation and test procedures which will enhance both the reliability and performance of system on chip designs
作者: 個阿姨勾引你    時間: 2025-3-24 05:07

作者: 容易懂得    時間: 2025-3-24 09:25
https://doi.org/10.1007/1-84628-145-8Hardware; Microelectronics; System-on-Chip; Validation; microprocessor; modeling; reliability; software; sys
作者: 有毛就脫毛    時間: 2025-3-24 12:51
978-1-84996-953-6Springer-Verlag London 2005
作者: 偽書    時間: 2025-3-24 15:46
System-level Test and Validation of Hardware/Software Systems978-1-84628-145-7Series ISSN 1437-0387 Series E-ISSN 2197-6643
作者: 違反    時間: 2025-3-24 21:33

作者: Campaign    時間: 2025-3-25 02:35
Z. Peng,M. Sonza Reorda,M. Violanteels of programmers.Honest assessments that are not biased to.YOU HAVE TO OWN THIS BOOK!..Software Exorcism: A Handbook for Debugging and Optimizing Legacy Code. takes an unflinching, no bulls$&# look at behavioral problems in the software engineering industry, shedding much-needed light on the socia
作者: evanescent    時間: 2025-3-25 04:07

作者: Boycott    時間: 2025-3-25 10:40
G. Jervan,R. Ubar,Z. Peng,P. Elesiation. Software, in particular, is embedded in most technical and electronic products, ranging from massive machines such as airplanes to lightweight devices such as mobile phones. Software applications are essential for the proper functioning of these products and their associated service offering
作者: 忘恩負義的人    時間: 2025-3-25 13:05
E. Sánchez,M. Sonza Reorda,G. Squillero result of insufficient cache memory where the software system just comes to an unexpected halt without any explanation of what happened. This chapter presents the concept of near misses, as immediate precursors to major software failures, through providing complete and relevant evidence of the soft
作者: exceed    時間: 2025-3-25 18:04
I. G. Harrisan relations (Boehm and Ross, 1989). The software project manager simultaneously satisfies several constituencies (users, customers, developers, maintainers, and management) whose desires frequently create fundamental conflicts that often result in functional, project, political, financial, technica
作者: GRUEL    時間: 2025-3-25 22:05
G. Jervan,R. Ubar,Z. Peng,P. Elesan relations (Boehm and Ross, 1989). The software project manager simultaneously satisfies several constituencies (users, customers, developers, maintainers, and management) whose desires frequently create fundamental conflicts that often result in functional, project, political, financial, technica
作者: Perennial長期的    時間: 2025-3-26 01:39
A. Bobbio,D. Codetta Raiteri,M. De Pierro,G. Franceschinisan relations (Boehm and Ross, 1989). The software project manager simultaneously satisfies several constituencies (users, customers, developers, maintainers, and management) whose desires frequently create fundamental conflicts that often result in functional, project, political, financial, technica
作者: Prophylaxis    時間: 2025-3-26 07:12
an relations (Boehm and Ross, 1989). The software project manager simultaneously satisfies several constituencies (users, customers, developers, maintainers, and management) whose desires frequently create fundamental conflicts that often result in functional, project, political, financial, technica
作者: 坦白    時間: 2025-3-26 09:51
1437-0387 performance of system on chip designs.New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers...SOC is a
作者: CHECK    時間: 2025-3-26 14:30

作者: 好開玩笑    時間: 2025-3-26 19:23
Test Program Generation from High-level Microprocessor Descriptions,vered through the whole design cycle to generate test-programs able to achieve a high FC% at gate-level. Most of the efforts of the methodology presented are focused on test program generation from high-level microprocessor descriptions. A case study is presented tackling a pipelined microprocessor core.
作者: Self-Help-Group    時間: 2025-3-26 23:50
Modeling Permanent Faults,d at structural level, became mandatory to constrain design quality and costs. However, as product complexity increases, the test process (including test planning, DfT and test preparation) needs to be concurrently carried out with the design process, as early as possible during the top-down phase,
作者: morale    時間: 2025-3-27 04:43

作者: Esophagitis    時間: 2025-3-27 09:03

作者: MELD    時間: 2025-3-27 13:05
Test Generation: A Hierarchical Approach,y, on the other hand, is usually considered only when the detailed structural information of the design is available. This is mainly due to the lack of general applicability of the existing high-level test generation and design-for-test methods. In this chapter we will present an improvement of the
作者: Ataxia    時間: 2025-3-27 14:02
Test Program Generation from High-level Microprocessor Descriptions,ing from early design phases. The methodology is based on an almost automatic tool and could be applied to generate test-programs for stand-alone microprocessor cores as well as for these embedded in systems-on-chip. The main idea is to take advantage of all possible microprocessor descriptions deli
作者: COLIC    時間: 2025-3-27 21:46
Tackling Concurrency and Timing Problems,ic execution. A concurrent system can perform many different correct computations for a given input sequence because the absolute order of execution is dependent on factors which cannot be known at design/compile time. Synchronization constructs are used to restrict the set of possible computations
作者: 做事過頭    時間: 2025-3-28 01:08
An Approach to System-level Design for Test,h, where the test set is assembled from pseudorandom test patterns that are generated online and deterministic test patterns that are generated offline and stored in the system. We have analyzed the aspects related to the cost calculation of such a hybrid BIST approach and will propose a test cost m
作者: meretricious    時間: 2025-3-28 04:40
System-level Dependability Analysis, which is made up of several .. We assume that the components, which may be designed with the support of hardware—software codesign tools, are characterized by dependability (. failure rate) parameters, which may derive from simulators of the components while they are under development, or as a resu
作者: 空中    時間: 2025-3-28 06:47
Book 2005 (SOC), together with its associated manufacturing problems, represents a real challenge for designers...SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until
作者: 橫條    時間: 2025-3-28 12:47

作者: separate    時間: 2025-3-28 15:27
System-level Dependability Analysis, a given component or subset of components. The analysis is performed by applying . (FTA) techniques enhanced with recently introduced features that allow one to remove the components’ independence assumptions imposed by classical FTA, and to include the possibility of component as well as subsystem repair.




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