標(biāo)題: Titlebook: Smart Multimedia; Third International Stefano Berretti,Guan-Ming Su Conference proceedings 2022 The Editor(s) (if applicable) and The Auth [打印本頁] 作者: intern 時間: 2025-3-21 18:15
書目名稱Smart Multimedia影響因子(影響力)
書目名稱Smart Multimedia影響因子(影響力)學(xué)科排名
書目名稱Smart Multimedia網(wǎng)絡(luò)公開度
書目名稱Smart Multimedia網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Smart Multimedia被引頻次
書目名稱Smart Multimedia被引頻次學(xué)科排名
書目名稱Smart Multimedia年度引用
書目名稱Smart Multimedia年度引用學(xué)科排名
書目名稱Smart Multimedia讀者反饋
書目名稱Smart Multimedia讀者反饋學(xué)科排名
作者: maroon 時間: 2025-3-21 22:14
arious forms of power dissipation in the presence of process variations of nano-CMOS technologies.? The authors show very large-scale integration (VLSI) researchers and engineers how to minimize the different types of power consumption of digital circuits. The material deals primarily with high-leve作者: GIDDY 時間: 2025-3-22 02:43 作者: obtuse 時間: 2025-3-22 07:01 作者: Vulvodynia 時間: 2025-3-22 12:36 作者: FILLY 時間: 2025-3-22 13:15 作者: UTTER 時間: 2025-3-22 21:08
on on power reduction fundamentals, specifically peak power ..Low-Power High-Level Synthesis for Nanoscale CMOS Circuits. addresses the need for analysis, characterization, estimation, and optimization of the various forms of power dissipation in the presence of process variations of nano-CMOS techn作者: aviator 時間: 2025-3-22 23:57
Guanfang Dong,Anup Basuarious forms of power dissipation in the presence of process variations of nano-CMOS technologies.? The authors show very large-scale integration (VLSI) researchers and engineers how to minimize the different types of power consumption of digital circuits. The material deals primarily with high-leve作者: 披肩 時間: 2025-3-23 01:22
Jiajia Zhang,Pei Xiang,Xiang Teng,Xin Zhang,Huixin Zhouarious forms of power dissipation in the presence of process variations of nano-CMOS technologies.? The authors show very large-scale integration (VLSI) researchers and engineers how to minimize the different types of power consumption of digital circuits. The material deals primarily with high-leve作者: hermitage 時間: 2025-3-23 08:18
Xiang Teng,Jiajia Zhang,Zhe Zhang,Sijian Hou,Jun Tang,Huixin Zhouarious forms of power dissipation in the presence of process variations of nano-CMOS technologies.? The authors show very large-scale integration (VLSI) researchers and engineers how to minimize the different types of power consumption of digital circuits. The material deals primarily with high-leve作者: Incumbent 時間: 2025-3-23 11:38 作者: 美食家 時間: 2025-3-23 14:19
Edgard Musafiri Mimo,Troy McDanielon on power reduction fundamentals, specifically peak power ..Low-Power High-Level Synthesis for Nanoscale CMOS Circuits. addresses the need for analysis, characterization, estimation, and optimization of the various forms of power dissipation in the presence of process variations of nano-CMOS techn作者: Champion 時間: 2025-3-23 20:55
Yujin Wu,Mohamed Daoudion on power reduction fundamentals, specifically peak power ..Low-Power High-Level Synthesis for Nanoscale CMOS Circuits. addresses the need for analysis, characterization, estimation, and optimization of the various forms of power dissipation in the presence of process variations of nano-CMOS techn作者: 放牧 時間: 2025-3-24 01:52 作者: 陳舊 時間: 2025-3-24 04:27 作者: Chauvinistic 時間: 2025-3-24 08:38 作者: irreparable 時間: 2025-3-24 14:04
Nasim Hajari,Irene Cheng cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circui作者: 金桌活畫面 時間: 2025-3-24 16:19 作者: 刺激 時間: 2025-3-24 19:09
Rahatara Ferdousi,Nabila Mabruba,Fedwa Laamarti,Abdulmotaleb El Saddik,Chunsheng Yang cost, lower power consumption, higher yield, and higher re-configurability. This has recently generated a great demand for low-power, low-voltage A/D converters that can be realized in a mainstream deep-submicron CMOS technology. However, the discrepancies between lithography wavelengths and circui作者: myriad 時間: 2025-3-25 02:49 作者: 愚蠢人 時間: 2025-3-25 05:39 作者: CLOWN 時間: 2025-3-25 07:58
IARG: Improved Actor Relation Graph Based Group Activity Recognitionild the actor relationship graph to allow the graph convolution network to learn how to classify group activities. We demonstrate that our approach significantly outperforms existing state-of-the-art techniques on the public group activity recognition datasets called collective activity dataset and 作者: 大門在匯總 時間: 2025-3-25 14:30
Infrared and Visible Image Fusion Based on Multi-scale Gaussian Rolling Guidance Filter Decompositioespectively. Then, the three different scale layers are respectively fused based on the properties of different scale layers through spatial frequency-based, gradient-based and energy-based fusion strategies. Finally, the final fusion result is obtained by adding the fusion results of the three diff作者: badinage 時間: 2025-3-25 19:51 作者: 獨(dú)裁政府 時間: 2025-3-25 23:58
Gamified Smart Grid Implementation Through Pico, Nano, and Microgrids in a Sustainable Campust of things (IoT) applications provide advanced monitoring and control in the smart grid in case of an outage or disturbances. Therefore, this paper presents a microgrid, nanogrid, and picogrid integration using a building facility at Tecnologico de Monterrey, Mexico City Campus. Besides, a solar ph作者: 白楊魚 時間: 2025-3-26 01:40
A Real-Time Fall Classification Model Based on?Frame Series Motion Deformationem, including viewing direction of the camera and illumination condition of the environment is quite challenging. The problem would be even more serious when the training dataset does not have representative features as the surveillance area. In this paper, we propose a robust, real-time, CV based f作者: 擦掉 時間: 2025-3-26 06:03
GradXcepUNet: Explainable AI Based Medical Image Segmentationduce the final segmentation results. With the assistance of XAI analysis and visualization, our GradXcepUNet outperforms the original U-Net and many state-of-the-art methods. The evaluation results show that we can reach a Dice coefficient of 97.73% and an Intersection over Union (IoU) score of 78.8作者: 努力趕上 時間: 2025-3-26 09:32
3D Segmentation and?Visualization of?Human Brain CT Images for?Surgical Training - A VTK Approachnvironment for Ventricular puncture operation planning and training. The difference between our work and other segmentation techniques is that we need to segment not only one target, but also the path along the surgical tool inserted into the brain. This creates challenges to the algorithm design be作者: 撤退 時間: 2025-3-26 13:50 作者: BRIDE 時間: 2025-3-26 20:53 作者: excursion 時間: 2025-3-26 22:49
Zijian Kuang,Xinran Tien implementation..The book is a self-contained low-power, high-level synthesis text for Nanoscale VLSI design engineers and researchers. Each chapter has simple relevant examples for a better grasp of the principles presented. Several algorithms are given to provide a better understanding of the und作者: jabber 時間: 2025-3-27 04:02 作者: WAG 時間: 2025-3-27 07:34
Jiajia Zhang,Pei Xiang,Xiang Teng,Xin Zhang,Huixin Zhoun implementation..The book is a self-contained low-power, high-level synthesis text for Nanoscale VLSI design engineers and researchers. Each chapter has simple relevant examples for a better grasp of the principles presented. Several algorithms are given to provide a better understanding of the und作者: 破布 時間: 2025-3-27 11:33 作者: 打包 時間: 2025-3-27 15:40
n implementation..The book is a self-contained low-power, high-level synthesis text for Nanoscale VLSI design engineers and researchers. Each chapter has simple relevant examples for a better grasp of the principles presented. Several algorithms are given to provide a better understanding of the und作者: 表狀態(tài) 時間: 2025-3-27 20:27 作者: Coterminous 時間: 2025-3-27 23:02
Amandeep Kaur,Guanfang Dong,Anup Basuhin each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability 作者: 巨頭 時間: 2025-3-28 03:21 作者: URN 時間: 2025-3-28 09:17
Zijian Kuang,Lihang Ying,Xinran Tie,Shi Jinnoscale VLSI design engineers and researchers. Each chapter has simple relevant examples for a better grasp of the principles presented. Several algorithms are given to provide a better understanding of the und978-1-4419-4554-9978-0-387-76474-0作者: compel 時間: 2025-3-28 13:46
Zijian Kuang,Xinran Tie,Xuanyi Wu,Lihang Yingnoscale VLSI design engineers and researchers. Each chapter has simple relevant examples for a better grasp of the principles presented. Several algorithms are given to provide a better understanding of the und978-1-4419-4554-9978-0-387-76474-0作者: 腐蝕 時間: 2025-3-28 17:54 作者: narcotic 時間: 2025-3-28 22:20
noscale VLSI design engineers and researchers. Each chapter has simple relevant examples for a better grasp of the principles presented. Several algorithms are given to provide a better understanding of the und978-1-4419-4554-9978-0-387-76474-0作者: ARC 時間: 2025-3-29 02:01 作者: HAIRY 時間: 2025-3-29 03:32 作者: 箴言 時間: 2025-3-29 11:08
Citlaly Pérez,Juana Isabel Méndez,Antonio Rivera,Pedro Ponce,Sergio Castellanos,Therese Peffer,Alan cale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability 978-94-024-0530-9978-90-481-9725-5Series ISSN 1872-082X Series E-ISSN 2197-1854 作者: 跳動 時間: 2025-3-29 11:52
Chenggui Sun,Li Bin Song,Lihang Yingcale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability 978-94-024-0530-9978-90-481-9725-5Series ISSN 1872-082X Series E-ISSN 2197-1854 作者: PAD416 時間: 2025-3-29 18:29 作者: panorama 時間: 2025-3-29 19:51
Palak,Benjamin Delbos,Rémi Chalard,Richard Moreau,Arnaud Lelevé,Irene Chengcale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability 978-94-024-0530-9978-90-481-9725-5Series ISSN 1872-082X Series E-ISSN 2197-1854 作者: 傳授知識 時間: 2025-3-30 02:23 作者: HERTZ 時間: 2025-3-30 06:10
https://doi.org/10.1007/978-3-031-22061-6artificial intelligence; computer networks; computer security; computer systems; computer vision; Human-C作者: regale 時間: 2025-3-30 09:57 作者: Project 時間: 2025-3-30 15:17
Smart Multimedia978-3-031-22061-6Series ISSN 0302-9743 Series E-ISSN 1611-3349
