標題: Titlebook: Remembering Sofya Kovalevskaya; Michèle Audin Book 2011 Springer-Verlag London Limited 2011 19th century mathematics.Sofya Kovalevskaya [打印本頁] 作者: Deflated 時間: 2025-3-21 19:50
書目名稱Remembering Sofya Kovalevskaya影響因子(影響力)
書目名稱Remembering Sofya Kovalevskaya影響因子(影響力)學科排名
書目名稱Remembering Sofya Kovalevskaya網(wǎng)絡公開度
書目名稱Remembering Sofya Kovalevskaya網(wǎng)絡公開度學科排名
書目名稱Remembering Sofya Kovalevskaya被引頻次
書目名稱Remembering Sofya Kovalevskaya被引頻次學科排名
書目名稱Remembering Sofya Kovalevskaya年度引用
書目名稱Remembering Sofya Kovalevskaya年度引用學科排名
書目名稱Remembering Sofya Kovalevskaya讀者反饋
書目名稱Remembering Sofya Kovalevskaya讀者反饋學科排名
作者: 激怒某人 時間: 2025-3-21 21:06
https://doi.org/10.1007/978-0-85729-929-119th century mathematics; Sofya Kovalevskaya作者: 內(nèi)向者 時間: 2025-3-22 02:11 作者: agnostic 時間: 2025-3-22 06:56 作者: AXIS 時間: 2025-3-22 10:02 作者: 逢迎春日 時間: 2025-3-22 13:39 作者: Fresco 時間: 2025-3-22 17:28 作者: 吹牛大王 時間: 2025-3-22 22:55
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: Pelvic-Floor 時間: 2025-3-23 02:33
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: 鉤針織物 時間: 2025-3-23 05:43
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: Sarcoma 時間: 2025-3-23 13:34
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: 闡釋 時間: 2025-3-23 14:50 作者: 離開就切除 時間: 2025-3-23 18:34 作者: BLANC 時間: 2025-3-23 22:47
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: 死亡 時間: 2025-3-24 05:27 作者: braggadocio 時間: 2025-3-24 10:14
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: aerobic 時間: 2025-3-24 12:08 作者: enchant 時間: 2025-3-24 17:02
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: aspersion 時間: 2025-3-24 22:38
Michèle Audino post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic作者: custody 時間: 2025-3-25 02:44 作者: 紡織品 時間: 2025-3-25 06:06 作者: 溫室 時間: 2025-3-25 08:26
Reduced Ordered Binary Decision Diagrams(ROBDDs), data structures that provide compact representations formany Boolean functions occurring in practical applications. We havenow seen the development of algorithms for functional decompositionwhich work directly based on ROBDDs, so that the decompositi作者: creditor 時間: 2025-3-25 12:14 作者: 彈藥 時間: 2025-3-25 19:17
Michèle Audinwork for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices..978-90-481-8112-4978-1-4020-9365-4Series ISSN 1876-1100 Series E-ISSN 1876-1119 作者: anagen 時間: 2025-3-25 21:45 作者: 1分開 時間: 2025-3-26 00:30 作者: headway 時間: 2025-3-26 06:56 作者: 旁觀者 時間: 2025-3-26 09:50 作者: 襲擊 時間: 2025-3-26 13:17
Michèle Audinwork for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices..978-90-481-8112-4978-1-4020-9365-4Series ISSN 1876-1100 Series E-ISSN 1876-1119 作者: aristocracy 時間: 2025-3-26 17:27 作者: OPINE 時間: 2025-3-26 21:12
Michèle Audinwork for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices..978-90-481-8112-4978-1-4020-9365-4Series ISSN 1876-1100 Series E-ISSN 1876-1119 作者: 過份 時間: 2025-3-27 01:48 作者: Musket 時間: 2025-3-27 06:00 作者: 稱贊 時間: 2025-3-27 09:57
Michèle Audinwork for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices..978-90-481-8112-4978-1-4020-9365-4Series ISSN 1876-1100 Series E-ISSN 1876-1119 作者: Aggrandize 時間: 2025-3-27 15:02 作者: 保存 時間: 2025-3-27 21:49
ch also examines Kovalevskaya’s love of literature, will be of interest to historians looking for a treatment of the mathematics, and those doing feminist or gender studies.978-1-4471-6935-2978-0-85729-929-1
