標(biāo)題: Titlebook: Reliable Design of Electronic Equipment; An Engineering Guide Dhanasekharan Natarajan Book 2015 Springer International Publishing Switzerla [打印本頁] 作者: tricuspid-valve 時間: 2025-3-21 16:57
書目名稱Reliable Design of Electronic Equipment影響因子(影響力)
書目名稱Reliable Design of Electronic Equipment影響因子(影響力)學(xué)科排名
書目名稱Reliable Design of Electronic Equipment網(wǎng)絡(luò)公開度
書目名稱Reliable Design of Electronic Equipment網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Reliable Design of Electronic Equipment被引頻次
書目名稱Reliable Design of Electronic Equipment被引頻次學(xué)科排名
書目名稱Reliable Design of Electronic Equipment年度引用
書目名稱Reliable Design of Electronic Equipment年度引用學(xué)科排名
書目名稱Reliable Design of Electronic Equipment讀者反饋
書目名稱Reliable Design of Electronic Equipment讀者反饋學(xué)科排名
作者: 雪崩 時間: 2025-3-21 20:54 作者: Congestion 時間: 2025-3-22 01:35 作者: foreign 時間: 2025-3-22 07:34
Dhanasekharan Natarajanze in light of Tunisia’s political transition. In the first section, they use the pragmatist approach to qualify as “public” the type of experience which takes place when human beings perceive that they are . affected by transactions carried out by some of their peers and that they develop ways to t作者: AMBI 時間: 2025-3-22 12:46 作者: DENT 時間: 2025-3-22 13:12 作者: 可憎 時間: 2025-3-22 20:16 作者: 無王時期, 時間: 2025-3-22 22:58 作者: Clinch 時間: 2025-3-23 03:03
Dhanasekharan Natarajanion. The paradigm of . may serve as a reference for a whole series of technical activities: the production of objects and tools, the construction of buildings, of infrastructures, the synthesis of substances which do not exist in nature. It is the art of .; it applies equally to the art of the craft作者: 確定方向 時間: 2025-3-23 08:05
Dhanasekharan Natarajancessible to the international philosophical community.?The first section, “Negotiating a Cultural Heritage,” presents?a number of leading 20th century philosophical figures?(from Bergson and Canguilhem to Simondon, Dagognet or Ellul) and intellectual movements (from Personalism to French Cybernetics作者: CODE 時間: 2025-3-23 10:29
ed with positivism, of modern technology as a mere application of science. I examine how and to what extent three French philosophers pursued non-Comtean insights into the relations between science and technology: some decades before the emerging STS wave that swept in as the 1970s wound down, they 作者: 貪婪的人 時間: 2025-3-23 14:10
g.Provides comprehensive presentation with applications and This book explains reliability techniques with examples from electronics design for the benefit of engineers. It presents the application of de-rating, FMEA, overstress analyses and reliability improvement tests for designing reliable elect作者: 果仁 時間: 2025-3-23 21:57 作者: ingestion 時間: 2025-3-23 22:17
Generic Stress Factors and De-rating,ress factors of electronic components. The generic stress factors, ambient temperature, surface temperature, and junction temperature that are common to most components are explained with examples. The basics of de-rating, applying de-rating for stress factors, and thermal resistance are also explai作者: 鈍劍 時間: 2025-3-24 03:08 作者: indifferent 時間: 2025-3-24 09:56
Failure Mode and Effects Analysis,heir consequences for achieving total reliability. All engineers without exception do apply FMEA in the design of electronic equipment to prevent obvious design errors, and examples are provided for the application. However, the detection of latent design errors requires applying FMEA systematically作者: 大暴雨 時間: 2025-3-24 13:30 作者: 令人苦惱 時間: 2025-3-24 17:20 作者: 討好美人 時間: 2025-3-24 22:09
Failure Data Management,onic equipment. The failures are categorized as electrical performance, component and mechanical failures. Organizing a failure data management system (FDMS) to handle the failure data is presented. Practical considerations for the root cause analysis of component failures and classifying the origin作者: 喃喃而言 時間: 2025-3-25 01:09
Reliability Database System for Design,evelopment activities of electronic equipment. Designing the database system to provide support for the application of components, overstress analyses, FMEA, internal verification testing, qualification testing, and failure analysis reports is explained.作者: Toxoid-Vaccines 時間: 2025-3-25 05:39 作者: BLANK 時間: 2025-3-25 08:21
Selection and Application of Components,ve components are listed. Guidelines for deciding the quantum of de-rating for the stress factors are provided. Application information for the components is also presented and they are based on the application notes of manufacturers, literature, and root cause analysis on component failures.作者: 貿(mào)易 時間: 2025-3-25 12:42 作者: CLOUT 時間: 2025-3-25 16:44 作者: 極為憤怒 時間: 2025-3-25 20:47 作者: 逗留 時間: 2025-3-26 03:37
Overview of Reliability Design,analyses, internal electrical, and environmental testing superimposed with reliability improvement tests, and qualification testing. Brief explanation for the reliability techniques and methods of integrating the techniques with the design and development of an electronic item are presented.作者: 洞察力 時間: 2025-3-26 04:25
Failure Mode and Effects Analysis,. The terms, the benefits, and the application of FMEA are explained with examples from electronic designs for the benefit of circuit designers. FMEA improves the competence of designers and enhances the reliability and maintainability (R&M) of equipment. The documentation of FMEA becomes an asset to organizations.作者: SHRIK 時間: 2025-3-26 11:33 作者: cogent 時間: 2025-3-26 13:57 作者: Canyon 時間: 2025-3-26 16:52
Generic Stress Factors and De-rating,ress factors of electronic components. The generic stress factors, ambient temperature, surface temperature, and junction temperature that are common to most components are explained with examples. The basics of de-rating, applying de-rating for stress factors, and thermal resistance are also explained.作者: dysphagia 時間: 2025-3-27 01:00
Reliability Database System for Design,evelopment activities of electronic equipment. Designing the database system to provide support for the application of components, overstress analyses, FMEA, internal verification testing, qualification testing, and failure analysis reports is explained.作者: Triglyceride 時間: 2025-3-27 03:07
Statistical Analysis of Field Failure Data,enefits could be realized by analyzing accumulated field failure data statistically. Analyzing the failure data of field replaceable electronic items using statistical probability distributions and predicting spares are illustrated with examples.作者: STANT 時間: 2025-3-27 07:24
978-3-319-36168-0Springer International Publishing Switzerland 2015作者: Calculus 時間: 2025-3-27 12:37 作者: 使混合 時間: 2025-3-27 13:54 作者: Jejune 時間: 2025-3-27 20:37
https://doi.org/10.1007/978-3-319-09111-2Computerized Reliability Database Systems; Electronics Design; FMEA; Overstress Analyses; Reliability Im作者: periodontitis 時間: 2025-3-28 00:07 作者: 云狀 時間: 2025-3-28 04:36 作者: Ibd810 時間: 2025-3-28 09:20
Dhanasekharan Natarajan Another result deals with the space occupied today by an audience of ordinary people in the mass media forum and in the new online media space. In the latter there is little presence due to media censorship, social self-censorship and political censorship.作者: 商議 時間: 2025-3-28 12:50 作者: 的闡明 時間: 2025-3-28 17:20 作者: 易碎 時間: 2025-3-28 21:49 作者: PACK 時間: 2025-3-29 00:14 作者: 冷淡一切 時間: 2025-3-29 03:10
Dhanasekharan Natarajanesults. These are the multiple ways of adjusting to nature as could be done with a partner. These are not the arts of making but of doing-with, of inducing things to happen. To such a model belong agriculture and animal-raising, all the arts of controlled fermentation, as well as therapy..It is not 作者: cliche 時間: 2025-3-29 07:44
