標(biāo)題: Titlebook: Microelectronic Test Structures for CMOS Technology; Manjul Bhushan,Mark B. Ketchen Book 2011 Springer Science+Business Media, LLC 2011 Bh [打印本頁] 作者: IU421 時(shí)間: 2025-3-21 18:41
書目名稱Microelectronic Test Structures for CMOS Technology影響因子(影響力)
書目名稱Microelectronic Test Structures for CMOS Technology影響因子(影響力)學(xué)科排名
書目名稱Microelectronic Test Structures for CMOS Technology網(wǎng)絡(luò)公開度
書目名稱Microelectronic Test Structures for CMOS Technology網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Microelectronic Test Structures for CMOS Technology被引頻次
書目名稱Microelectronic Test Structures for CMOS Technology被引頻次學(xué)科排名
書目名稱Microelectronic Test Structures for CMOS Technology年度引用
書目名稱Microelectronic Test Structures for CMOS Technology年度引用學(xué)科排名
書目名稱Microelectronic Test Structures for CMOS Technology讀者反饋
書目名稱Microelectronic Test Structures for CMOS Technology讀者反饋學(xué)科排名
作者: Flinch 時(shí)間: 2025-3-21 22:25 作者: 脫毛 時(shí)間: 2025-3-22 03:34 作者: urethritis 時(shí)間: 2025-3-22 06:54
Test Structures for SOI Technology,e circuits have higher immunity to latch up and to soft errors generated by incident radiation. In partially depleted silicon-on-insulator (PD-SOI) technology, electrical isolation of the MOSFET body from the underlying silicon substrate facilitates modulation of the threshold voltage, providing an opportunity for further circuit performance gain.作者: Peristalsis 時(shí)間: 2025-3-22 10:27 作者: 輕快走過 時(shí)間: 2025-3-22 16:10 作者: Measured 時(shí)間: 2025-3-22 17:56
Capacitors, of inter-level dielectric properties such as effective dielectric constant and film geometries such as layer thicknesses and linewidths. . characteristics of diodes are used for profiling carrier densities in silicon devices. Carrier lifetime measurement in silicon utilizes . and . characteristics of MOS capacitors.作者: Solace 時(shí)間: 2025-3-23 00:10
MOSFETs,Statistical fluctuations in the number of dopant atoms in the channel and local linewidth variations lead to variability in parameters of nominally identical MOSFETs. Hence, the focus on MOSFET macro design and test in this chapter primarily concerns DC . and variability characterization.作者: Dungeon 時(shí)間: 2025-3-23 01:56 作者: 充氣女 時(shí)間: 2025-3-23 06:34 作者: commodity 時(shí)間: 2025-3-23 09:55
Test Structure Basics,er dicing and packaging the test structure. The design of test structures is therefore closely coupled to the method of interfacing to the test equipment and the capabilities and limitations of the test equipment itself. Design and test efficiency is improved by standardizing the footprints of each 作者: AMEND 時(shí)間: 2025-3-23 16:33
Resistors,ured to monitor and control material properties such as film thickness and doping levels in silicon layers. Resistance measurements are utilized in monitoring product yield loss caused by electrical opens in metal wires and inter-level vias, or shorts between neighboring wires. In metrology and for 作者: Nonflammable 時(shí)間: 2025-3-23 18:19 作者: Incisor 時(shí)間: 2025-3-24 01:24 作者: 煩躁的女人 時(shí)間: 2025-3-24 03:35 作者: Crater 時(shí)間: 2025-3-24 08:59 作者: Debark 時(shí)間: 2025-3-24 12:33
Test Structures for SOI Technology, an oxide layer. CMOS circuits fabricated on an SOI substrate have inherent low parasitic source and drain junction capacitance and hence a potential for achieving higher switching speeds relative to circuits fabricated on bulk silicon. Because of electrical isolation and a smaller device volume, th作者: 揮舞 時(shí)間: 2025-3-24 16:04
Test Equipment and Measurements, characterization of MOSFETs and resistance measurements can be carried out with constant voltage or constant current power supplies, voltmeters, and ammeters. Capacitance measurements, in the absence of any on-chip active circuitry, require dedicated impedance meters operating over a range of frequ作者: 有權(quán)威 時(shí)間: 2025-3-24 20:45 作者: Crumple 時(shí)間: 2025-3-25 01:13
Manjul Bhushan,Mark B. Ketchen shape and value of human life. South Korea has implemented the national project of building a model smart city that is futuristic and innovative. Two megaprojects are underway the Sejong Administrative City (Sejong 5-1 Life Zone) and the Busan Eco Delta City (Busan Eco Delta Smart City) and have be作者: BACLE 時(shí)間: 2025-3-25 06:46
Manjul Bhushan,Mark B. Ketchenfor projects in a portfolio. Decisions involve different stakeholders at various levels in an organization with different constructs, interpretations, and expectations of value. This chapter explores the role of value in decision-making for agile project portfolios. In consideration of projects as a作者: 新星 時(shí)間: 2025-3-25 11:30
Manjul Bhushan,Mark B. Ketchenzing and of the way people collaborate, in general and particularly in projects. Concepts of self-organization are often used unconsciously, e.g., in the context of agile project management approaches. This chapter therefore prepares the topic fundamentally, points out essential backgrounds, drivers作者: glacial 時(shí)間: 2025-3-25 15:15
Manjul Bhushan,Mark B. Ketchenzation plays an outstanding role. Here, self-organization sometimes stands for autonomous teams, time management, agile forms of organization, or new work, to name just a few. Only in the rarest of cases the statement “The whole is more than the sum of its parts” is in the foreground. And this is ex作者: GREG 時(shí)間: 2025-3-25 19:10 作者: BOLT 時(shí)間: 2025-3-25 22:39
Manjul Bhushan,Mark B. Ketchen. Manuals and websites provide instructions on how to do it. However, the origins and meanings of the term remain rather hazy. Essentially, it stands for new forms of work associated with an important change in the governance and culture of work. Self-organization in work, which is increasingly dema作者: 都相信我的話 時(shí)間: 2025-3-26 02:45
Manjul Bhushan,Mark B. Ketcheninized what conceptions and placement criteria for an informal line of best fit TEs used and discussed the relationship between TEs’ conceptions and criteria to draw implications for teaching and research. We used basic qualitative research design and conducted approximately one-hour-long task-based作者: LAPSE 時(shí)間: 2025-3-26 06:08
Manjul Bhushan,Mark B. Ketcheninized what conceptions and placement criteria for an informal line of best fit TEs used and discussed the relationship between TEs’ conceptions and criteria to draw implications for teaching and research. We used basic qualitative research design and conducted approximately one-hour-long task-based作者: 受辱 時(shí)間: 2025-3-26 12:24 作者: aggressor 時(shí)間: 2025-3-26 15:20
Manjul Bhushan,Mark B. Ketchennship in statistics education.Includes chapters on reasoning.This book is derived from selected papers from the Fourteenth International Congress on Mathematical Education Topic Study Group 12, Teaching and Learning Statistics. It describes recent research? on curriculum, pedagogy and outreach initi作者: Calibrate 時(shí)間: 2025-3-26 18:46 作者: 摸索 時(shí)間: 2025-3-26 23:33 作者: 名字 時(shí)間: 2025-3-27 04:08
Ring Oscillators,same circuit elements. The currents drawn by a ring oscillator in its active and quiescent states, together with its frequency, provide useful information for establishing power and performance trade-offs in a CMOS product.作者: 文件夾 時(shí)間: 2025-3-27 06:58 作者: Strength 時(shí)間: 2025-3-27 12:28
Manjul Bhushan,Mark B. Ketchenects that have existed. It is necessary to develop a new model that is appropriate for assessment of megaprojects. We propose the Segway model to evaluate megaprojects. The Segway model can provide a meaningful contribution for “the assessment“ of megaproject excellence by analysing the connectivity作者: micturition 時(shí)間: 2025-3-27 15:39 作者: synchronous 時(shí)間: 2025-3-27 17:49
Manjul Bhushan,Mark B. Ketchenore adaptable and resilient to the ever-changing context they are operating in. However, this requires a departure from the traditional principles of an organization, including moving away from the principle of hierarchy and empowering employees to work voluntarily and self-determined.作者: 生命 時(shí)間: 2025-3-28 01:03 作者: 惰性女人 時(shí)間: 2025-3-28 04:14
Manjul Bhushan,Mark B. Ketchen. Springer, New York, 1983) and the model of self-organization according to Haken and Schiepeck (Synergetik in der Psychologie. Selbstorganisation verstehen und gestalten. Hogrefe, G?ttingen, 2010). We explain Agile Mindset with the help of the neurological layers of the Dilts Pyramid (Dilts in A br作者: 枯燥 時(shí)間: 2025-3-28 08:19
Manjul Bhushan,Mark B. Ketchenociology-of-work perspective: flexible work in terms of space and time, new spaces of work, (agile) project work and self-organization. The focus is set on the respective potentials, limits, and approaches for the design of our present world of work.作者: EXCEL 時(shí)間: 2025-3-28 11:50 作者: 證實(shí) 時(shí)間: 2025-3-28 16:48 作者: 配置 時(shí)間: 2025-3-28 20:45 作者: Fibrillation 時(shí)間: 2025-3-28 23:37 作者: 遍及 時(shí)間: 2025-3-29 05:39
Microelectronic Test Structures for CMOS Technology作者: hieroglyphic 時(shí)間: 2025-3-29 09:28
Microelectronic Test Structures for CMOS Technology978-1-4419-9377-9作者: 門窗的側(cè)柱 時(shí)間: 2025-3-29 14:37 作者: amyloid 時(shí)間: 2025-3-29 19:08 作者: Interregnum 時(shí)間: 2025-3-29 21:57 作者: Isolate 時(shí)間: 2025-3-30 03:02
Manjul Bhushan,Mark B. KetchenProvides a comprehensive guide to designing the most effective and lowest-cost microelectronic test structures.Uses specific examples of good design techniques and discusses common errors to avoid in
