標(biāo)題: Titlebook: Lifetime Reliability-aware Design of Integrated Circuits; Mohsen Raji,Behnam Ghavami Book 2023 The Editor(s) (if applicable) and The Autho [打印本頁] 作者: Iodine 時間: 2025-3-21 19:30
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書目名稱Lifetime Reliability-aware Design of Integrated Circuits讀者反饋
書目名稱Lifetime Reliability-aware Design of Integrated Circuits讀者反饋學(xué)科排名
作者: 針葉樹 時間: 2025-3-21 20:14
Mohsen Raji,Behnam Ghavamial development through engaging him/her in meaningful and authentic tasks. The new Turkish mathematics curriculum is based on constructivist educational approaches and advocates the wide usage of educational activities that help to make mathematical concepts and relations meaningful. The purpose of 作者: Density 時間: 2025-3-22 01:51
Mohsen Raji,Behnam Ghavami high prior knowledge in the continuous-virtual group presented higher scores in learning enjoyment and mathematics anxiety than those in the integrated-virtual and continuous-physical groups, and those in the continuous-virtual group also displayed greater learning motivation than those in the inte作者: 惰性氣體 時間: 2025-3-22 05:45 作者: 遍及 時間: 2025-3-22 11:26 作者: 強(qiáng)制性 時間: 2025-3-22 14:39 作者: 諷刺 時間: 2025-3-22 20:16 作者: 中古 時間: 2025-3-22 22:05 作者: Malcontent 時間: 2025-3-23 02:04
that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. ??.978-3-031-15347-1978-3-031-15345-7作者: 輕浮女 時間: 2025-3-23 08:51
and societal debates mean that teachers’ abilities in engaging with the teaching of rival narratives are very different. The volume will be compelling reading for students and researchers in the fields of educ978-1-137-55432-1作者: Irritate 時間: 2025-3-23 09:54 作者: watertight, 時間: 2025-3-23 17:23 作者: invade 時間: 2025-3-23 21:43 作者: 賭博 時間: 2025-3-24 01:49 作者: Hyaluronic-Acid 時間: 2025-3-24 05:25
Mohsen Raji,Behnam GhavamiProvides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits.Describes state-of-the art aging- and process variation-aware CAD algorithms.Includes reliability作者: LANCE 時間: 2025-3-24 09:41
http://image.papertrans.cn/l/image/585964.jpg作者: 歹徒 時間: 2025-3-24 11:08 作者: 認(rèn)為 時間: 2025-3-24 16:47 作者: 抵消 時間: 2025-3-24 22:59
Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits,, in the second stage, we reduce the delay degradation induced by aging and process variations. To this end, two novel concepts, called aging probability and delay degradation-aware gate criticality, are introduced that enable us to perform gate sizing efficiently using an adaptive multiobjective ranking approach.作者: 啟發(fā) 時間: 2025-3-25 00:11
Book 2023eliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. ??.作者: Dictation 時間: 2025-3-25 06:42
process variation-aware CAD algorithms.Includes reliability.This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability o作者: crumble 時間: 2025-3-25 07:59
Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops,s are studied and compared, taking into account some main sources of variabilities, such as process variations and aging effects. Extensive Monte-Carlo-based HSPICE simulations are exploited to statistically evaluate and compare the timing reliability of FFs in addition to their power consumption as well as power-delay products.作者: 預(yù)兆好 時間: 2025-3-25 13:16
Lifetime Reliability Improvement of Pulsed Flip-Flops,roved using a transistor-level restructuring technique. In this technique, we modify the pull-down network of pulsed FFs to decrease the stress time (i.e., the time of being ON) of the pulsed clock transistors.作者: SLUMP 時間: 2025-3-25 18:29
s presented in textbooks, and the historical memories of teaThis book presents a survey of approaches to dealing with ‘rival histories’ in the classroom, arguing that approaching this problem requires great sensitivity to differing national, educational and narrative contexts. Contested narratives a作者: PAEAN 時間: 2025-3-25 22:23 作者: 小畫像 時間: 2025-3-26 01:32
Mohsen Raji,Behnam Ghavamire in great demand for all subjects in primary and secondary schools. However, the ubiquitous nature of these activities does not always guarantee students’ conceptual development if enough consideration was not given to the design and implementation of the system and an appropriate role was not def作者: Hay-Fever 時間: 2025-3-26 06:59
Mohsen Raji,Behnam Ghavami performance and attitude of fifth-graders learning of equivalent fractions. The participants were divided into three groups based on the teaching method to which they were exposed: continuous examples paired with physical manipulatives (continuous-physical group), continuous examples paired with vi作者: 全國性 時間: 2025-3-26 09:54
Mohsen Raji,Behnam Ghavamifor learning materials that aid children to think mathematically, they are faced with a challenge of how to select materials that meet the needs of students. The profusion of virtual learning tools available via the Internet magnifies this challenge. What criteria could teachers use when choosing us作者: pacific 時間: 2025-3-26 15:05 作者: visual-cortex 時間: 2025-3-26 18:21
Mohsen Raji,Behnam Ghavamie at either the state or the national level. While Geographic Information Systems (GIS) is still at a nascent stage in terms of the overall curriculum at the secondary school level, its importance and relevance in higher education and in certain sectors of the job market has significantly grown in t作者: 調(diào)整校對 時間: 2025-3-27 00:01 作者: troponins 時間: 2025-3-27 02:37
Restructuring-Based Lifetime Reliability Improvement of Nanoscale Master-Slave Flip-Flops,functionality of flip-flops (FFs), which is one of the most important elements in digital circuits, plays a key role in the reliability of modern circuit designs. In this chapter, a timing reliability improvement technique is proposed for master-slave FFs, taking into account the impacts of process 作者: 誤傳 時間: 2025-3-27 08:12
Lifetime Reliability Improvement of Pulsed Flip-Flops,ufacturing process variation and aging phenomena, affecting the reliability of these FFs. In this chapter, the timing reliability of pulsed FFs is improved using a transistor-level restructuring technique. In this technique, we modify the pull-down network of pulsed FFs to decrease the stress time (作者: INCUR 時間: 2025-3-27 12:52 作者: 山頂可休息 時間: 2025-3-27 16:08
Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits,d yield. In this chapter, we propose a new two-phase gate sizing approach in order to improve the reliability of circuits while considering the joint effects of process variation and transistor aging. In the first stage, the initial delay of the circuit is optimized to improve its timing yield. Then作者: engagement 時間: 2025-3-27 18:39 作者: KEGEL 時間: 2025-3-28 00:52
