標(biāo)題: Titlebook: Introduction to Focused Ion Beams; Instrumentation, The Lucille A. Giannuzzi,Fred A. Stevie Book 2005 Springer-Verlag US 2005 SIMS.instrume [打印本頁] 作者: 娛樂某人 時間: 2025-3-21 20:07
書目名稱Introduction to Focused Ion Beams影響因子(影響力)
書目名稱Introduction to Focused Ion Beams影響因子(影響力)學(xué)科排名
書目名稱Introduction to Focused Ion Beams網(wǎng)絡(luò)公開度
書目名稱Introduction to Focused Ion Beams網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Introduction to Focused Ion Beams被引頻次
書目名稱Introduction to Focused Ion Beams被引頻次學(xué)科排名
書目名稱Introduction to Focused Ion Beams年度引用
書目名稱Introduction to Focused Ion Beams年度引用學(xué)科排名
書目名稱Introduction to Focused Ion Beams讀者反饋
書目名稱Introduction to Focused Ion Beams讀者反饋學(xué)科排名
作者: Commonwealth 時間: 2025-3-21 22:27
Ion - Solid Interactions,materials is presented. The problems of redeposition associated with an increase in sputtering yield within a confined trench are presented. Knowledge of ion - solid interactions may be used to prepare excellent quality FIB milled surfaces.作者: FELON 時間: 2025-3-22 01:38
Focused Ion Beam Gases for Deposition and Enhanced Etch,d, selective material removal provides the capabilities for a much wider range of micromachining applications. This chapter introduces FIB material deposition and chemically enhanced material removal processes, lists some of the FIB chemical precursors in common use and discusses the parameters for their use, and presents several examples.作者: 物種起源 時間: 2025-3-22 04:51 作者: 吹牛大王 時間: 2025-3-22 11:48 作者: 制定法律 時間: 2025-3-22 12:56 作者: custody 時間: 2025-3-22 18:34
the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.978-1-4419-3574-8978-0-387-23313-0作者: Mindfulness 時間: 2025-3-22 22:20
High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy,uch as energy dispersive x-ray spectroscopy (EDS), wavelength dispersive x-ray spectroscopy (WDS), secondary ion mass spectrometry (SIMS) etc. Real time high resolution SEM imaging of the cutting and deposition process enables the researcher to perform very accurate three dimensional structural examinations and device modifications.作者: 抱怨 時間: 2025-3-23 03:32 作者: tattle 時間: 2025-3-23 06:50 作者: CORE 時間: 2025-3-23 12:41 作者: 沒花的是打擾 時間: 2025-3-23 16:19
The Uses of Dual Beam FIB in Microelectronic Failure Analysis,ures and to generate smear-free cross-sections of structures having layers of differing hardnesses is very difficult to do using mechanical techniques; this becomes routine using the dual beam FIB. The dual beam FIB is a must-have tool for cross-sectioning MEMS devices without inducing catastrophic damage.作者: enumaerate 時間: 2025-3-23 18:27 作者: instate 時間: 2025-3-24 01:09
The Focused Ion Beam Instrument,uter. The liquid metal ion source provides the finely focused ion beam that makes possible high lateral resolution removal of material. Five axis motorized eucentric stage motion allows rapid sputtering at various angles to the specimen. The ion beam interaction with organo-metallic species facilita作者: DIS 時間: 2025-3-24 02:58 作者: dry-eye 時間: 2025-3-24 08:42 作者: Gleason-score 時間: 2025-3-24 11:19 作者: 有效 時間: 2025-3-24 18:25 作者: 外形 時間: 2025-3-24 20:38
High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy,erials science related applications. Through the combination of the Gemini ultrahigh resolution field emission SEM column and the Canion31+ high performance FIB column a wide field of applications can be accessed. This includes structural cross-sections for SEM and transmission electron microscopy (作者: 開頭 時間: 2025-3-25 00:35 作者: 得意人 時間: 2025-3-25 04:27 作者: Blasphemy 時間: 2025-3-25 07:40
Dual-Beam (FIB-SEM) Systems,advantages over a single-beam FIB system, especially for sample preparation and microscopy applications, in which the ion beam can be used for site-specific material removal and the SEM for nondestructive imaging and analysis. Dual-beam system configurations are presented, along with a number of key作者: 一再困擾 時間: 2025-3-25 15:30 作者: PALMY 時間: 2025-3-25 17:07 作者: 放逐 時間: 2025-3-25 20:32 作者: 生銹 時間: 2025-3-26 00:26 作者: 灌溉 時間: 2025-3-26 07:22 作者: 細(xì)查 時間: 2025-3-26 10:49
Lucille A. Giannuzzi,Brenda I. Prenitzer,Brian W. Kempshall companies.Offers a theoretical background in innovation.Thi.This monograph investigates a multitude of emerging technologies including 3D printing, 5G, blockchain, and many more to assess their potential for use to further humanity’s shared goal of sustainable development. Through case studies deta作者: 橫條 時間: 2025-3-26 15:23
F. A. Stevie,D. P. Griffis,P. E. Russellave confined people at their homes which is leading them to use digital technologies such as Internet, social media, smartphones, more than ever before. The problematic use of these digital technologies may impact their mental and emotional health. This chapter discusses the role of machine learning作者: 粘土 時間: 2025-3-26 17:37 作者: 拋射物 時間: 2025-3-26 21:24
Kultaransingh Bobby N. Hooghane large current transients in the power delivery system, resulting in V. droop and overshoot fluctuations. The magnitude and duration of V. droops and overshoots depend on the interaction of capacitive and inductive parasitics at the board, package, and die levels with changes in current demand [1].作者: bromide 時間: 2025-3-27 04:03
Becky Holdfordessive scaling is reaching its limits and the control of semiconductor manufacturing process is becoming increasingly difficult. Variations in manufacturing process have grown, and variations in device parameters have grown even more, resulting in wider distributions which, in turn, could result in 作者: 縱欲 時間: 2025-3-27 05:21
Peter Gnauck,Peter Hoffrogge,M. Schumannessive scaling is reaching its limits and the control of semiconductor manufacturing process is becoming increasingly difficult. Variations in manufacturing process have grown, and variations in device parameters have grown even more, resulting in wider distributions which, in turn, could result in 作者: glisten 時間: 2025-3-27 09:49 作者: flaggy 時間: 2025-3-27 15:15 作者: 聯(lián)想 時間: 2025-3-27 21:14
L. A. Giannuzzi,B. W. Kempshall,S. M. Schwarz,J. K. Lomness,B. I. Prenitzer,F. A. Stevieas organized by the Open Research Society, NGO, http://www.open-knowledge-society.org, and took place in the American College of Greece, http://www.acg.gr, during September 24–27, 2008, in Athens, Greece. The World Summit on the Knowledge Society Series is an international attempt to promote a dialo作者: infatuation 時間: 2025-3-28 01:13
ve solutions within their curricula. At the same time, Augmented reality (AR) is an emerging technology in the Immersive Learning Landscape. The EU-funded Erasmus?+?project Enlivened Laboratories in STEM (EL-STEM) aims to introduce a new approach, through the provision of integrated inquiry-based ST作者: 擁護(hù) 時間: 2025-3-28 02:40
978-1-4419-3574-8Springer-Verlag US 2005作者: left-ventricle 時間: 2025-3-28 08:26 作者: flex336 時間: 2025-3-28 11:03
FIB for Materials Science Applications - a Review,The application of focused ion beam techniques to a range of topics in materials science is reviewed. Recent examples in the literature are cited along with illustrations of numerous applications. Potential artifacts that can arise are discussed along with commentary on minimizing their impact.作者: follicular-unit 時間: 2025-3-28 16:26
FIB Lift-Out Specimen Preparation Techniques,In this chapter, we review methods and applications of the FIB lift-out specimen preparation technique. A historical overview of the development of the technique is given. The ex-situ and in-situ lift-out techniques are described. Examples, advantages, and disadvantages of each of the techniques are presented.作者: 顯赫的人 時間: 2025-3-28 19:55 作者: 賭博 時間: 2025-3-28 23:30 作者: muscle-fibers 時間: 2025-3-29 04:16 作者: 灌輸 時間: 2025-3-29 07:49
https://doi.org/10.1007/b101190SIMS; instruments; material; microscopy; spectroscopy作者: 和平主義 時間: 2025-3-29 13:32
F. A. Stevie,L. A. Giannuzzi,B. I. Prenitzer the complex mechanisms that characterize the emergence of risk in technology innovation, .Emerging Technological Risk. bridges contributions from many disciplines in order to sustain a fruitful debate. .Emerging Technological Risk. is one of a series of books developed by the Dependability Interdis作者: 逗留 時間: 2025-3-29 15:38
F. A. Stevie,D. P. Griffis,P. E. RussellThe results convey that 11.71% of users show addictive Twitter usage patterns and 4.05% of users show highly addictive Twitter usage patterns while 2.70% of users show dangerously addictive usage patterns. “Sadness” and “anger” are the dominating emotions among these users in contrast to “happiness”作者: Altitude 時間: 2025-3-29 23:21 作者: 歡樂中國 時間: 2025-3-30 01:50
Kultaransingh Bobby N. Hooghanmance by increasing F. or lower power by lowering V. during favorable operating conditions. Since most systems usually operate at nominal conditions where worst-case scenarios rarely occur, these infrequent dynamic variations severely limit the performance and energy efficiency of conventional micro作者: Narrative 時間: 2025-3-30 07:53
Becky Holdford, the reverse-biased drain and source substrate junction band to band tunneling (Ibtbt), and the gate induced drain leakage (Igidl). Each of those leakage currents becomes significant in nano-scaled devices tightening the constraints of nowadays digital designs [2].作者: Flu表流動 時間: 2025-3-30 12:00 作者: 幻想 時間: 2025-3-30 13:22 作者: 催眠藥 時間: 2025-3-30 19:53
Ron Anderson,Stanley J. Klepeisty during plasma processing, extensively studied during the last two decades for SiO.. Consideration of the charging polarity has recently been recognized as one of indispensable guidelines in designing an antenna rule [11] for different devices (n- or p-channel) to prevent a yield loss [12]. In ord作者: ovation 時間: 2025-3-30 22:31 作者: 親屬 時間: 2025-3-31 03:32
.Emerging Technological Risk. bridges contributions from many disciplines in order to sustain a fruitful debate. .Emerging Technological Risk. is one of a series of books developed by the Dependability Interdis978-1-4471-5993-3978-1-4471-2143-5作者: 和平 時間: 2025-3-31 05:20 作者: 航海太平洋 時間: 2025-3-31 09:18 作者: 繁榮中國 時間: 2025-3-31 15:26
A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method,TEM specimen preparations are feasible with this technique. In addition, a technique to prepare TEM specimens from a specific site has also been developed. In this technique, an FIB system equipped with a FIB/TEM(STEM) compatible specimen holder is used for thinning of the samples, e.g., a micro-sam
