標(biāo)題: Titlebook: Integrated Circuit Defect-Sensitivity: Theory and Computational Models; José Pineda Gyvez Book 1993 Springer Science+Business Media New Yo [打印本頁] 作者: FAULT 時間: 2025-3-21 20:01
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models影響因子(影響力)
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models影響因子(影響力)學(xué)科排名
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書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models被引頻次
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models被引頻次學(xué)科排名
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models年度引用
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models年度引用學(xué)科排名
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models讀者反饋
書目名稱Integrated Circuit Defect-Sensitivity: Theory and Computational Models讀者反饋學(xué)科排名
作者: 混沌 時間: 2025-3-21 20:49
Defect Semantics and Yield Modeling,luding the necessary relationship between process induced defects and faults[24,42,74,94].The second main topic is an objective discussion on yield modeling, it’s difficulties and development through the last 30 years.作者: 才能 時間: 2025-3-22 03:57
Introduction,it area (defect density). By understanding the effect of defects in IC designs, it is possible to devise yield tolerant methodologies, e.g. module allocation with “balanced defect sensitivities”, “defect tolerant” driven techniques for placement and routing, etc.作者: 危險 時間: 2025-3-22 06:01 作者: 銼屑 時間: 2025-3-22 08:45
Single Defect Multiple Layer (SDML) Model, either a short or a break. Yet if the defect falls in the poly-diffusion area of a transistor it can be fatal even if it does not totally break the geometrical pattern. It is thus not sufficient to extract single-layer critical areas if either an accurate yield prediction or a realistic layout to fault extraction are desired.作者: RECUR 時間: 2025-3-22 15:42
IC Yield Prediction and Single Layer Critical Areas,s implementing the same function. The layout styles are Standard Cells (STD), Programmable Logic Array (PLA), and Transistor Gate Matrix (TM), see Fig. 7.1. The technology is CMOS of 2μm of minimum resolution features.作者: CERE 時間: 2025-3-22 17:31 作者: 災(zāi)禍 時間: 2025-3-23 00:53
The Springer International Series in Engineering and Computer Sciencehttp://image.papertrans.cn/i/image/468443.jpg作者: 預(yù)防注射 時間: 2025-3-23 04:59 作者: candle 時間: 2025-3-23 07:47 作者: Classify 時間: 2025-3-23 13:03
José Pineda de Gyvezus of the World Health Organization says in the Foreword, “This new expanded edition comes as a timely essential aid against the growing threats of inhuman violence and destructive disasters.”978-1-4614-4444-2978-1-4614-4445-9作者: Myelin 時間: 2025-3-23 16:22 作者: corporate 時間: 2025-3-23 20:16 作者: myocardium 時間: 2025-3-24 01:37 作者: enchant 時間: 2025-3-24 04:04
0893-3405 as that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC‘s). Those fabrication plants would be concentrated with only a few market leaders.978-1-4613-6383-5978-1-4615-3158-6Series ISSN 0893-3405 作者: Bombast 時間: 2025-3-24 08:27
Computational Models for Defect-Sensitivity,a malfunction in the respective circuit arises. Critical areas are open connected sets of critical points [36,83,84]. They naturally depend on the layout geometry and on the defect size involved. Thus, the defect-sensitivity of a design is obtained as the ratio of the total critical area to the tota作者: 發(fā)現(xiàn) 時間: 2025-3-24 12:39 作者: 恭維 時間: 2025-3-24 15:19 作者: Interdict 時間: 2025-3-24 19:29
Single vs. Multiple Layer Critical Areas,odels are good to evaluate the safeness of the artwork as a function of the probability of failure of its layers, that is, whether the patterns can undesirably be broken or joined. In the long trajectory of yield modeling, it was found that by obtaining the critical areas, a more realistic yield pre作者: MEN 時間: 2025-3-24 23:12
Introduction,s of silicon layer structures mainly caused by dust particles, process variabilities, and contaminations of the fabrication equipment. Spot defects are in essence random phenomena occurring on the wafer with certain stochastic spatial distribution and also with a stochastic size and frequency per un作者: pacifist 時間: 2025-3-25 06:35
Defect Semantics and Yield Modeling,ent high-level abstraction without considering the technology. Yet, faults have their origins in changes of the chemical and material compositions occurring in the IC. Defects have very complex physical characteristics and may be significantly different from technology to technology [15,16,92]. The 作者: ingenue 時間: 2025-3-25 09:43 作者: senile-dementia 時間: 2025-3-25 12:01 作者: Meander 時間: 2025-3-25 19:18 作者: anthesis 時間: 2025-3-25 22:54 作者: delta-waves 時間: 2025-3-26 01:08 作者: colony 時間: 2025-3-26 06:49
Single vs. Multiple Layer Critical Areas,how how much error is incurred by using an SDSL model and a given layout design style. Disadvantages of SDSL models were mentioned in previous chapters and are now briefly recalled. .)The calculated critical areas account only for short/break type of faults, .) All patterns in every layer are consid作者: Overdose 時間: 2025-3-26 11:20
José Pineda de Gyvezional disaster relief work.Covers the entire multidisciplinaThe 2nd edition of the Dictionary of Disaster Medicine and Humanitarian Relief is an essential and practical reference for all those who work in humanitarian relief. ?This new, expanded edition presents more than 3000 definitions and acrony作者: PIZZA 時間: 2025-3-26 13:03
ional disaster relief work.Covers the entire multidisciplinaThe 2nd edition of the Dictionary of Disaster Medicine and Humanitarian Relief is an essential and practical reference for all those who work in humanitarian relief. ?This new, expanded edition presents more than 3000 definitions and acrony作者: cajole 時間: 2025-3-26 18:58
Gilbert Hottoised mechanisms for achieving supply chain coordination under uncertainty, generating many fruitful analytical and empirical results. Despite the abundance of research results, there is an absence of a comprehensive reference source that provides state-of-the-art findings on both theoretical and appli作者: 用肘 時間: 2025-3-26 22:43
ember 15 - 19, 1986. The meeting was the sequel to the one held at Wuppertal in 1985, the Proceedings of which have appeared in the same Plenum series. During the past few years, a considerable number of meetings on lat- tice gauge theory have been held, on both sides of the Atlantic. With our works作者: 剝削 時間: 2025-3-27 01:12
Upgrading Color Distributions for Image Retrieval Can We Do Better?ous color representation spaces, color and illumination invariance, color quantization and color matching. In order to overcome the many limitations of the description by a firstorder distribution, several higherorder distributions have been introduced since (like autocorrelogram or color coherence 作者: 有權(quán)威 時間: 2025-3-27 09:00
Analyzing Meteorological Data for?Curated Music Selectionata analysis and machine learning techniques, we aim to create personalized playlists that align with the current weather conditions. Our research addresses the challenge of correlating weather elements with musical attributes and explores real-time adaptation, potentially revolutionizing the way in作者: SMART 時間: 2025-3-27 10:39
Fehlgeschlagene Modernisierung als SicherheitsproblemFragen sind sowohl in der Wissenschaft als auch in der Praxis bereits er?rtert worden, aber nach dem 11. September 2001 sind sie wesentlich wichtiger geworden. Es handelt sich hierbei um die Rolle des Islam sowie die sozialen und politischen Verh?ltnisse in denjenigen L?ndern, aus denen die Terroris作者: 鞭子 時間: 2025-3-27 17:19 作者: 變化 時間: 2025-3-27 18:55
Lockouts in Scandinavia, c. 1900–1938 65 per cent of all workers involved in conflicts were locked out. The mass sympathy lockout was introduced in Denmark in 1899 and became an inspiration to Scandinavian employers for decades. In the early stage the lockout was used to secure managerial control, later it was primarily employed to cut作者: 船員 時間: 2025-3-27 23:04 作者: 可用 時間: 2025-3-28 03:02
https://doi.org/10.1007/978-3-030-27126-8 in einem interdisziplin?ren Kontext gleicherma?en zu einer angemessenen Betreuungspraxis beitragen. Das Buch bildet in diesem Rahmen einen Wissensfundus, ohne eine notwendige Leitlinienarbeit zu ersetzen.作者: heirloom 時間: 2025-3-28 07:15
A Framework for Analyzing Uncertainty in Data Using Computational Intelligence Techniques,ttaining complete and consistent data. Thus, automated medical diagnosis can be done efficiently by using computational intelligence (CI) techniques for the benefit of mankind to live a healthy long life.作者: Moderate 時間: 2025-3-28 13:18 作者: WAG 時間: 2025-3-28 16:04 作者: BUOY 時間: 2025-3-28 21:28 作者: 值得贊賞 時間: 2025-3-29 02:21 作者: 調(diào)情 時間: 2025-3-29 04:51
2625-3577 stematically studied. Additionally, the turn-on dynamics and modulation response curves of two-state lasing devices are presented.978-3-658-09401-0978-3-658-09402-7Series ISSN 2625-3577 Series E-ISSN 2625-3615 作者: Assignment 時間: 2025-3-29 08:44
gitimacy is often omitted or its importance is minimized even when it is often the most valued type of legitimacy by the population affected by the conflict, and the differentiation between political support and legitimacy, which serves the Western world well, leads us to miss that performance legit作者: Adjourn 時間: 2025-3-29 13:36
