標(biāo)題: Titlebook: High-Resolution Electron Microscopy for Materials Science; Daisuke Shindo,Kenji Hiraga Book 1998 Springer-Verlag Tokyo 1998 advanced mater [打印本頁(yè)] 作者: False-Negative 時(shí)間: 2025-3-21 17:17
書(shū)目名稱High-Resolution Electron Microscopy for Materials Science影響因子(影響力)
書(shū)目名稱High-Resolution Electron Microscopy for Materials Science影響因子(影響力)學(xué)科排名
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書(shū)目名稱High-Resolution Electron Microscopy for Materials Science讀者反饋
書(shū)目名稱High-Resolution Electron Microscopy for Materials Science讀者反饋學(xué)科排名
作者: 值得贊賞 時(shí)間: 2025-3-22 00:06
High-Resolution Electron Microscopy for Materials Science978-4-431-68422-0作者: 不可思議 時(shí)間: 2025-3-22 03:10
ungen genutzt wird..Das Arbeitsbuch eignet sich gut als vorlesungsbegleitende Vertiefung und Einübung der dargebotenen Themen sowie zur Klausurvorbereitung. .978-3-642-30336-4Series ISSN 0937-7433 Series E-ISSN 2512-5214 作者: 愛(ài)得痛了 時(shí)間: 2025-3-22 06:14 作者: Inkling 時(shí)間: 2025-3-22 08:42
Daisuke Shindo,Kenji Hiragaungen genutzt wird..Das Arbeitsbuch eignet sich gut als vorlesungsbegleitende Vertiefung und Einübung der dargebotenen Themen sowie zur Klausurvorbereitung. .978-3-642-30336-4Series ISSN 0937-7433 Series E-ISSN 2512-5214 作者: Mercurial 時(shí)間: 2025-3-22 16:36 作者: penance 時(shí)間: 2025-3-22 20:34
Book 1998d materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.作者: Confidential 時(shí)間: 2025-3-22 22:16
t with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.978-4-431-70234-4978-4-431-68422-0作者: CUB 時(shí)間: 2025-3-23 03:18 作者: 浮雕 時(shí)間: 2025-3-23 09:28
978-4-431-70234-4Springer-Verlag Tokyo 1998作者: QUAIL 時(shí)間: 2025-3-23 11:06
http://image.papertrans.cn/h/image/426721.jpg作者: 直覺(jué)沒(méi)有 時(shí)間: 2025-3-23 15:27
Basis of High-Resolution Electron Microscopy,optical ray diagram with an optical objective lens, as shown in Fig. 1.1. When a crystal of lattice spacing . is irradiated with electrons of wavelength λ, diffracted waves will be produced at specific angles 2θ Satisfying the ., i.e., . The diffracted waves form diffraction spots on the .. In an el作者: Inferior 時(shí)間: 2025-3-23 18:28
Practice of High-Resolution Electron Microscopy,ugh the back focal plane, so various high-resolution images containing different information may be obtained depending on their scattering amplitudes, which are affected by the diffraction conditions and the crystal thicknesses. Thus, before observing high-resolution images, we should clarify what s作者: mucous-membrane 時(shí)間: 2025-3-23 22:11 作者: 極力證明 時(shí)間: 2025-3-24 06:18 作者: 流動(dòng)性 時(shí)間: 2025-3-24 07:04 作者: Ablation 時(shí)間: 2025-3-24 11:13 作者: Cloudburst 時(shí)間: 2025-3-24 17:30 作者: Anhydrous 時(shí)間: 2025-3-24 20:26 作者: Palter 時(shí)間: 2025-3-25 00:08
Book 1998of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential in作者: 暴露他抗議 時(shí)間: 2025-3-25 05:54
Basis of High-Resolution Electron Microscopy, the diffraction pattern forms is called the ., while the space at the image plane or at a specimen is called the .. As shown in the following section, the scattering from the specimen to the back focal plane, in other words, the transformation from the real space to the reciprocal space, is mathematically given by the ..作者: 羊欄 時(shí)間: 2025-3-25 11:04
Application of High-Resolution Electron Microscopy,on. Section 3.2 considers the appHcation of high-resolution electron microscopy to various advanced materials such as ceramics and high-Tc superconductors. Structural changes in alloys due to heat treatment and slight compositional changes, and the characteristic structural features of quasicrystals are also explained in detail.作者: Cupping 時(shí)間: 2025-3-25 14:32 作者: 使更活躍 時(shí)間: 2025-3-25 17:13
Peripheral Instruments and Techniques for High-Resolution Electron Microscopy, beam and optical lenses, optical diffractograms of electron microscope images have been obtained, and by inserting a phase filter and a mask, image reconstruction has been carried out by modulating the phases and the ampHtudes of the scattered beams.作者: crutch 時(shí)間: 2025-3-25 22:35
mic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Es作者: 組裝 時(shí)間: 2025-3-26 02:37
Mapping Properties of Layer Potentials Associated with Higher-Order Elliptic Operators in Lipschitz Domains,ators for a very long time; the literature on this topic is enormous. By way of contrast this method is disproportionally underdeveloped in the case of higher-order operators; the difference between the higher-order and the second-order settings is striking in term of the scientific output. This pap作者: 滲透 時(shí)間: 2025-3-26 08:07 作者: 子女 時(shí)間: 2025-3-26 08:49 作者: neutrophils 時(shí)間: 2025-3-26 14:46 作者: 轉(zhuǎn)向 時(shí)間: 2025-3-26 18:06
Y. Kitagawa,T. Matsuda,S. Iijimaodies were themselves capable of .. So in 1847, informed by his studies of heat produced during muscle action, he published an essay entitled .. In this essay, Helmholtz aimed to provide a “critical investigation and arrangement of the facts for the benefit of physiologists.” The facts to which he w作者: exceptional 時(shí)間: 2025-3-26 21:03 作者: 賠償 時(shí)間: 2025-3-27 01:27 作者: Alienated 時(shí)間: 2025-3-27 05:38 作者: Ointment 時(shí)間: 2025-3-27 12:59
https://doi.org/10.1007/978-3-030-91709-8elenksbiomechanik vorgenommen. Da nur axiale Kr?fte, wenn man von Reibungskr?ften absieht, übertragen werden, bedarf das Implantat nur kleiner Verankerungselemente. Somit erlaubt es im Revisionsfall den einfachen Rückzug auf einen komopletten Oberfl?chenersatz. [16, 22].作者: CAJ 時(shí)間: 2025-3-27 16:04 作者: rectocele 時(shí)間: 2025-3-27 17:56
