標題: Titlebook: Ellipsometry for Industrial Applications; Karl Riedling Book 1988 Springer-Verlag/Wien 1988 circuit.ellipsometry.film.semiconductor.surfac [打印本頁] 作者: 突然 時間: 2025-3-21 19:38
書目名稱Ellipsometry for Industrial Applications影響因子(影響力)
書目名稱Ellipsometry for Industrial Applications影響因子(影響力)學(xué)科排名
書目名稱Ellipsometry for Industrial Applications網(wǎng)絡(luò)公開度
書目名稱Ellipsometry for Industrial Applications網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Ellipsometry for Industrial Applications被引頻次
書目名稱Ellipsometry for Industrial Applications被引頻次學(xué)科排名
書目名稱Ellipsometry for Industrial Applications年度引用
書目名稱Ellipsometry for Industrial Applications年度引用學(xué)科排名
書目名稱Ellipsometry for Industrial Applications讀者反饋
書目名稱Ellipsometry for Industrial Applications讀者反饋學(xué)科排名
作者: Abbreviate 時間: 2025-3-21 20:41 作者: 大罵 時間: 2025-3-22 02:55
(numerical) calibration procedures are given wherever possible, and design and operation guidelines for high-speed instruments suitable for dynamic "in situ" measurements are suggested.978-3-211-82040-7978-3-7091-8961-0作者: 俗艷 時間: 2025-3-22 04:48 作者: 樸素 時間: 2025-3-22 08:52 作者: Excise 時間: 2025-3-22 15:05
in industrial areas, such as the technology of electronic devices, when simple instruments, many of them computer-controlled and automated, became available. The potential users of such instruments are, however, frequently aware neither of the inherent possibilities of this technique, nor of its ac作者: Excise 時間: 2025-3-22 18:11 作者: Ossification 時間: 2025-3-23 00:39
Logic Approximating Sequences of Setschnique within the field of microelectronic technology concentrate on the investigation of semiconducting substrates and layers, and the modifications they undergo during various technological processes. In most cases, spectroscopic methods are applied.作者: Mercurial 時間: 2025-3-23 03:35
http://image.papertrans.cn/e/image/307762.jpg作者: Judicious 時間: 2025-3-23 08:27
Temporal Logic: Formulas, Models, Tableaux,Ellipsometric measurements are, like any experiment, subject to various error effects which may distort their results to a more or less critical degree.作者: 生命 時間: 2025-3-23 10:47
Error Effects in Ellipsometric Investigations,Ellipsometric measurements are, like any experiment, subject to various error effects which may distort their results to a more or less critical degree.作者: incredulity 時間: 2025-3-23 14:58
https://doi.org/10.1007/978-3-7091-8961-0circuit; ellipsometry; film; semiconductor; surface; surface analysis; thin films作者: 有節(jié)制 時間: 2025-3-23 21:11
978-3-211-82040-7Springer-Verlag/Wien 1988作者: vitreous-humor 時間: 2025-3-24 00:53
Logic Approximating Sequences of Setschnique within the field of microelectronic technology concentrate on the investigation of semiconducting substrates and layers, and the modifications they undergo during various technological processes. In most cases, spectroscopic methods are applied.作者: accomplishment 時間: 2025-3-24 04:24 作者: separate 時間: 2025-3-24 07:59
Basics of Ellipsometry,t a monochromatic electromagnetic wave changes its state of polarization if it strikes non-perpendicularly the interface between two dielectric media. In general, any arbitrary monochromatic transversal wave can be considered composed of two orthogonal coherent waves with a fixed phase relation, e.g作者: 細節(jié) 時間: 2025-3-24 12:54
Ellipsometry in Microelectronic Technology,chnique within the field of microelectronic technology concentrate on the investigation of semiconducting substrates and layers, and the modifications they undergo during various technological processes. In most cases, spectroscopic methods are applied.作者: 原諒 時間: 2025-3-24 17:09
6樓作者: 暗指 時間: 2025-3-24 20:24
6樓作者: 假設(shè) 時間: 2025-3-25 02:56
6樓作者: PHON 時間: 2025-3-25 05:02
7樓作者: 馬籠頭 時間: 2025-3-25 10:40
7樓作者: obstruct 時間: 2025-3-25 13:24
7樓作者: Lasting 時間: 2025-3-25 16:23
7樓作者: 純樸 時間: 2025-3-25 23:40
8樓作者: PIZZA 時間: 2025-3-26 00:19
8樓作者: Junction 時間: 2025-3-26 06:11
8樓作者: 宮殿般 時間: 2025-3-26 10:43
8樓作者: Lament 時間: 2025-3-26 14:10
9樓作者: 粗鄙的人 時間: 2025-3-26 16:58
9樓作者: 庇護 時間: 2025-3-26 23:13
9樓作者: 上流社會 時間: 2025-3-27 03:27
9樓作者: 騎師 時間: 2025-3-27 09:12
10樓作者: 放棄 時間: 2025-3-27 09:59
10樓作者: climax 時間: 2025-3-27 17:37
10樓作者: Dealing 時間: 2025-3-27 18:15
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