派博傳思國(guó)際中心

標(biāo)題: Titlebook: EMC of Analog Integrated Circuits; Jean-Michel‘Redouté,Michiel‘Steyaert Book 2010 Springer Science+Business Media B.V. 2010 Analog.Analog [打印本頁(yè)]

作者: 頌歌    時(shí)間: 2025-3-21 18:38
書目名稱EMC of Analog Integrated Circuits影響因子(影響力)




書目名稱EMC of Analog Integrated Circuits影響因子(影響力)學(xué)科排名




書目名稱EMC of Analog Integrated Circuits網(wǎng)絡(luò)公開度




書目名稱EMC of Analog Integrated Circuits網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱EMC of Analog Integrated Circuits被引頻次




書目名稱EMC of Analog Integrated Circuits被引頻次學(xué)科排名




書目名稱EMC of Analog Integrated Circuits年度引用




書目名稱EMC of Analog Integrated Circuits年度引用學(xué)科排名




書目名稱EMC of Analog Integrated Circuits讀者反饋




書目名稱EMC of Analog Integrated Circuits讀者反饋學(xué)科排名





作者: Modify    時(shí)間: 2025-3-21 21:36
EMI Resisting Bandgap References and Low Dropout Voltage Regulators,econd and third coupling paths, namely through the parasitic capacitances associated to respectively the OTA and the pass transistor in LDO voltage regulators, are studied in the second case study. Based on the observations made in the first case study, an EMI resisting LDO voltage regulator topolog
作者: 步兵    時(shí)間: 2025-3-22 03:37
Book 2010ng an innate immunity to disturbances. The objective of the research domain presented in .EMC of Analog Integrated Circuits .is to improve the electromagnetic immunity of considered analog integrated circuits, so that they start to fail at relevantly higher conduction levels than before..
作者: 生來    時(shí)間: 2025-3-22 05:37

作者: evaculate    時(shí)間: 2025-3-22 11:42
https://doi.org/10.1007/978-3-322-92744-6econd and third coupling paths, namely through the parasitic capacitances associated to respectively the OTA and the pass transistor in LDO voltage regulators, are studied in the second case study. Based on the observations made in the first case study, an EMI resisting LDO voltage regulator topolog
作者: VEN    時(shí)間: 2025-3-22 13:15
1872-082X EMC of Analog Integrated Circuits .is to improve the electromagnetic immunity of considered analog integrated circuits, so that they start to fail at relevantly higher conduction levels than before..978-94-007-3088-5978-90-481-3230-0Series ISSN 1872-082X Series E-ISSN 2197-1854
作者: VEN    時(shí)間: 2025-3-22 20:03

作者: verdict    時(shí)間: 2025-3-22 22:21
d disturbance level is sufficiently large. Following this theoretical explanation, four case studies, describing the NMOS diode, the NMOS source follower, the MOS current mirror and the basic diode clipping ESD protection illustrate the appearing EMC problems from a practical point of view.
作者: 比賽用背帶    時(shí)間: 2025-3-23 05:01

作者: 植物學(xué)    時(shí)間: 2025-3-23 08:18

作者: 不遵守    時(shí)間: 2025-3-23 11:05

作者: 紋章    時(shí)間: 2025-3-23 16:30

作者: etidronate    時(shí)間: 2025-3-23 21:59
Basic EMC Concepts at IC Level,actical standardized measurement setups. More importantly, it helps to fix the thought about what circuit elements play a significant role in the pickup of EMI using the dimensionless electrical length. In addition, the approach pursued in this chapter modestly contributes to the demystification of basic rule of thumb EMC rules and guidelines.
作者: Lipohypertrophy    時(shí)間: 2025-3-24 00:01

作者: 罐里有戒指    時(shí)間: 2025-3-24 04:17
Klassische Wachstumstheorie und EntwicklungThis chapter introduces EMC from a historical perspective, and describes the scope of the book.
作者: Herbivorous    時(shí)間: 2025-3-24 07:15

作者: Ostrich    時(shí)間: 2025-3-24 14:03
Introduction,This chapter introduces EMC from a historical perspective, and describes the scope of the book.
作者: 面包屑    時(shí)間: 2025-3-24 15:17
Epilogue,The most important conclusions of this work are summarized in Chap.?7, and future possible research paths based on this work are briefly enumerated.
作者: 思考而得    時(shí)間: 2025-3-24 19:15

作者: Countermand    時(shí)間: 2025-3-25 00:27

作者: Valves    時(shí)間: 2025-3-25 04:25
Kreuzungsanalyse bei diploiden Organismen,C at circuit level is shortly established and described. This description is far from complete; however, it summarizes the core ideas hidden behind practical standardized measurement setups. More importantly, it helps to fix the thought about what circuit elements play a significant role in the pick
作者: 健談的人    時(shí)間: 2025-3-25 08:50

作者: 正面    時(shí)間: 2025-3-25 13:23
https://doi.org/10.1007/978-3-8348-9277-5avior of output structures into two major families, namely output circuits of the common-drain type and those of the common-source type. It is shown mathematically that output circuits of the common-source type are much more immune to EMI compared to their common-drain counterparts. These observatio
作者: cancellous-bone    時(shí)間: 2025-3-25 19:07
https://doi.org/10.1007/978-3-8351-9105-1 that the immunity to EMI of an operational amplifier can significantly be increased by reducing the EMI induced offset generated in the input differential stage. After reviewing and studying existing EMI resisting differential input circuits as well as their respective advantages and disadvantages,
作者: hypnogram    時(shí)間: 2025-3-25 20:57

作者: 使人煩燥    時(shí)間: 2025-3-26 01:39

作者: Insufficient    時(shí)間: 2025-3-26 05:16

作者: 鎮(zhèn)壓    時(shí)間: 2025-3-26 10:02
978-94-007-3088-5Springer Science+Business Media B.V. 2010
作者: 蘑菇    時(shí)間: 2025-3-26 14:37
Basic EMC Concepts at IC Level,C at circuit level is shortly established and described. This description is far from complete; however, it summarizes the core ideas hidden behind practical standardized measurement setups. More importantly, it helps to fix the thought about what circuit elements play a significant role in the pick
作者: 圓錐    時(shí)間: 2025-3-26 19:44
EMC of Integrated Circuits versus Distortion,t, it is illustrated that EMI which is injected on nonlinear circuit nodes introduces nonlinear distortion. The worst EMI effect that appears is the EMI induced DC shift, which stems from an accumulation of even-order distortion components. EMI induced DC shift forms a potential threat to any electr
作者: 斗爭(zhēng)    時(shí)間: 2025-3-26 21:57
EMI Resisting Analog Output Circuits,avior of output structures into two major families, namely output circuits of the common-drain type and those of the common-source type. It is shown mathematically that output circuits of the common-source type are much more immune to EMI compared to their common-drain counterparts. These observatio
作者: 搜尋    時(shí)間: 2025-3-27 01:40

作者: motivate    時(shí)間: 2025-3-27 06:29
EMI Resisting Bandgap References and Low Dropout Voltage Regulators,paths can be distinguished when dealing with the EMI suppression of voltage regulator circuits. The first coupling path, namely the path which is responsible for corrupting and disturbing the bandgap reference circuit, is considered in the first case study. The effect of EMI on a classic Kuijk bandg
作者: 諂媚于性    時(shí)間: 2025-3-27 12:39
9樓
作者: cartilage    時(shí)間: 2025-3-27 15:56
9樓
作者: Ingenuity    時(shí)間: 2025-3-27 19:16
10樓
作者: Agnosia    時(shí)間: 2025-3-27 23:06
10樓
作者: Inflamed    時(shí)間: 2025-3-28 05:13
10樓
作者: packet    時(shí)間: 2025-3-28 06:30
10樓




歡迎光臨 派博傳思國(guó)際中心 (http://pjsxioz.cn/) Powered by Discuz! X3.5
桂阳县| 黔西| 宜都市| 南溪县| 铁岭县| 厦门市| 策勒县| 阜新| 都江堰市| 裕民县| 赤壁市| 丘北县| 平邑县| 清丰县| 黑水县| 密山市| 河津市| 弥勒县| 新宁县| 桃江县| 房产| 连平县| 大田县| 清流县| 满洲里市| 临潭县| 永新县| 刚察县| 永宁县| 舞钢市| 天等县| 广安市| 谢通门县| 余江县| 黄浦区| 正镶白旗| 汉中市| 乌海市| 凤城市| 岐山县| 阳泉市|