標題: Titlebook: Diffraction Analysis of the Microstructure of Materials; Eric J. Mittemeijer,Paolo Scardi Book 2004 Springer-Verlag Berlin Heidelberg 2004 [打印本頁] 作者: clot-buster 時間: 2025-3-21 20:03
書目名稱Diffraction Analysis of the Microstructure of Materials影響因子(影響力)
書目名稱Diffraction Analysis of the Microstructure of Materials影響因子(影響力)學科排名
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書目名稱Diffraction Analysis of the Microstructure of Materials網(wǎng)絡(luò)公開度學科排名
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書目名稱Diffraction Analysis of the Microstructure of Materials被引頻次學科排名
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書目名稱Diffraction Analysis of the Microstructure of Materials讀者反饋
書目名稱Diffraction Analysis of the Microstructure of Materials讀者反饋學科排名
作者: 商議 時間: 2025-3-21 21:04
Convolution Based Profile Fittingneral convolution approach to X-ray and neutron powder data is described, which can accurately convolute and refine a wide variety of profile shapes numerically, including user defined profiles, without the need to convolute analytically. With functions representing both the aberration functions of 作者: 立即 時間: 2025-3-22 04:09 作者: EVICT 時間: 2025-3-22 08:04
Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systemsr their structural investigation, two approaches for the full profile analysis of X-ray powder diffraction patterns are proposed. Use of the first one (the modified Rietveld algorithm) allows us to refine the average atomic structure parameters, including the atomic coordinates, the Debye—Waller fac作者: 夾克怕包裹 時間: 2025-3-22 09:15 作者: curettage 時間: 2025-3-22 14:51 作者: curettage 時間: 2025-3-22 20:30
Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Mnal standard is described and some applications are reported. Although the applicability of this method is not as wide as the internal standard one, it represents a valid alternative when the standard cannot be added to the sample, e.g. in bulk materials. This method can only be applied if the chemi作者: 僵硬 時間: 2025-3-23 00:50 作者: aneurysm 時間: 2025-3-23 04:58
Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wavethod is based on the measurement of the small-angle diffuse scattering in the transmitted wave and requires thin foil samples and well-defined incoming plane wave. The physical information is encoded in the wave modification due to primary extinction in the crystallites.作者: Conclave 時間: 2025-3-23 08:21 作者: 血友病 時間: 2025-3-23 12:50
Determination of Non-uniform Dislocation Distributions in Polycrystalline Materialsation distributions occur; i.e. not all glide systems contain the same density and/or type of dislocations. The discussion is illustrated by two practical examples. It is shown that for 111 textured Al layers sputter deposited on silicon, during deformation due to a biaxial stress, predominantly scr作者: Modicum 時間: 2025-3-23 16:15
Line Profile Fitting: The Case of , Crystals Containing Stacking Faultsing a general one-dimensional model. Features of the peak profiles have been found that allow the determination of the predominant type of stacking fault from an experimental XRD powder pattern with a high level of confidence. A non-monotonous change of the powder peak positions and their full width作者: 鉤針織物 時間: 2025-3-23 21:18 作者: 諂媚于性 時間: 2025-3-23 22:46 作者: 沒有準備 時間: 2025-3-24 02:34 作者: 殖民地 時間: 2025-3-24 07:05
Determining the Dislocation Contrast Factor for X-ray Line Profile AnalysisAn important step in quantifying dislocation broadening of a line profile is the evaluation of the .. In this way the elastic properties of the material, displacement field of the dislocations and geometric orientation of the diffraction vector relative to the dislocation slip-system are incorporated into the analysis.作者: Condyle 時間: 2025-3-24 14:24
Eric J. Mittemeijer,Paolo ScardiThe diffraction analysis is a powerful tool to characterize the microstructure, dislocations, interfaces and surfaces of microstructured materials and thin films..This book presents the method, theory作者: pulmonary 時間: 2025-3-24 15:14 作者: 云狀 時間: 2025-3-24 19:14
https://doi.org/10.1007/978-3-662-06723-9Diffraction Analysis; Dislocation; Helium-Atom-Streuung; Interface and Surface Effects; Powder diffracti作者: CANON 時間: 2025-3-25 00:17
978-3-642-07352-6Springer-Verlag Berlin Heidelberg 2004作者: 慢慢沖刷 時間: 2025-3-25 04:15 作者: 我還要背著他 時間: 2025-3-25 08:32 作者: CRATE 時間: 2025-3-25 12:15 作者: Migratory 時間: 2025-3-25 18:43
Susan Browne,Ga?tane Jean-Marier their structural investigation, two approaches for the full profile analysis of X-ray powder diffraction patterns are proposed. Use of the first one (the modified Rietveld algorithm) allows us to refine the average atomic structure parameters, including the atomic coordinates, the Debye—Waller fac作者: CRUDE 時間: 2025-3-25 21:47
Novea McIntosh,Rochonda L. Nenonenee improvements to existing models. For the crystallite-size modeling, we consider the size-broadened profile given by the lognormal size distribution of spherical crystallites. We derive an analytical approximation in terms of Lorentz and Gauss functions for the size-broadened profile. Its advantage作者: 巫婆 時間: 2025-3-26 01:27
Selfies: Putting the “Me” into Mediaof the amorphous phase, the sample is diluted with an internal standard which is considered as a component itself and refined with the other phases. Although the method is accurate for systems containing crystalline and amorphous phases with an absorption coefficient comparable to that of the standa作者: hegemony 時間: 2025-3-26 07:26 作者: 恭維 時間: 2025-3-26 11:07
Iyad Muhsen AlDajani,Martin Leinerpresented. This method will be used in certifying a nanocrystallite-size standard reference material (SRM) being developed at the National Institute of Standards and Technology (NIST). The proposed SRM will assist in ensuring that uniform procedures in quantifying the microstructure of nanocrystalli作者: 無思維能力 時間: 2025-3-26 13:10 作者: 謙虛的人 時間: 2025-3-26 20:28 作者: infelicitous 時間: 2025-3-26 21:49 作者: depreciate 時間: 2025-3-27 04:35 作者: CAND 時間: 2025-3-27 05:34 作者: 等級的上升 時間: 2025-3-27 11:25 作者: Evolve 時間: 2025-3-27 14:39 作者: 刻苦讀書 時間: 2025-3-27 21:44
0933-033X ns, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and?supplies readers sufficient information to apply the methods themselves. .978-3-642-07352-6978-3-662-06723-9Series ISSN 0933-033X Series E-ISSN 2196-2812 作者: 用樹皮 時間: 2025-3-28 01:04
Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systemsarameters, enables us to obtain quantitative information on the real structure of the nanocrystalline systems. The results of the real structure study of some practically important nanomaterials such as oxides, carbon materials, metals and alloys are also described.作者: 取之不竭 時間: 2025-3-28 02:10 作者: 誰在削木頭 時間: 2025-3-28 09:25
Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically El作者: Amnesty 時間: 2025-3-28 14:27 作者: 花費 時間: 2025-3-28 14:41
0933-033X erials and thin films..This book presents the method, theory.Diffraction Analysis of the Microstructure of Materials. provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive inf作者: 冬眠 時間: 2025-3-28 18:43
https://doi.org/10.1007/978-3-030-69013-7 importance in materials science and the study of structural imperfections by means of X-ray powder diffraction is known as Line Profile Analysis (LPA). Such a study is usually undertaken to investigate the nature of the microstructure arising from sample treatment, method of preparation, or some other influence.作者: 濕潤 時間: 2025-3-29 01:22
https://doi.org/10.1007/978-3-031-16644-0) polycrystalline materials, without using arbitrary profile functions. The entire diffraction pattern is modelled directly in terms of physical parameters describing the main microstructural features influencing peak profile width, shape and position, also considering instrumental effects and background.作者: medium 時間: 2025-3-29 06:00
Line Profile Analysis: A Historical Overview importance in materials science and the study of structural imperfections by means of X-ray powder diffraction is known as Line Profile Analysis (LPA). Such a study is usually undertaken to investigate the nature of the microstructure arising from sample treatment, method of preparation, or some other influence.作者: BURSA 時間: 2025-3-29 07:30 作者: debris 時間: 2025-3-29 11:35 作者: hereditary 時間: 2025-3-29 18:22
Selfies: Putting the “Me” into Mediard, it was not thoroughly tested for systems containing a weakly or highly absorbing amorphous phase. Commonly, this is the case for glass ceramics which may contain elements with fairly different atomic number.作者: 天賦 時間: 2025-3-29 22:06
Natalia Churchill,Caroline Barratt-Pughcal composition of the amorphous phase or, as an alternative, of the whole sample is known. This limitation can be a serious problem in the study of natural materials, but it usually does not constitute a problem in the study of synthetic products the composition of which is well known.作者: gratify 時間: 2025-3-30 00:23
Iyad Muhsen AlDajani,Martin Leinertes from X-ray line profile data are developed. This will become increasingly important as emerging nanotechnology applications begin to call for crystallites designed to have particular morphology and size distributions.作者: euphoria 時間: 2025-3-30 06:04 作者: ANT 時間: 2025-3-30 12:02
Book 2004g methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and?supplies readers sufficient information to apply the methods themselves. .作者: 結(jié)合 時間: 2025-3-30 12:31 作者: Enervate 時間: 2025-3-30 19:15 作者: Cabg318 時間: 2025-3-30 21:11
Book 2004 materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usual
