標(biāo)題: Titlebook: Auger- and X-Ray Photoelectron Spectroscopy in Materials Science; A User-Oriented Guid Siegfried Hofmann Book 2013 Springer-Verlag Berlin H [打印本頁(yè)] 作者: arouse 時(shí)間: 2025-3-21 16:53
書(shū)目名稱Auger- and X-Ray Photoelectron Spectroscopy in Materials Science影響因子(影響力)
書(shū)目名稱Auger- and X-Ray Photoelectron Spectroscopy in Materials Science影響因子(影響力)學(xué)科排名
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書(shū)目名稱Auger- and X-Ray Photoelectron Spectroscopy in Materials Science網(wǎng)絡(luò)公開(kāi)度學(xué)科排名
書(shū)目名稱Auger- and X-Ray Photoelectron Spectroscopy in Materials Science被引頻次
書(shū)目名稱Auger- and X-Ray Photoelectron Spectroscopy in Materials Science被引頻次學(xué)科排名
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書(shū)目名稱Auger- and X-Ray Photoelectron Spectroscopy in Materials Science讀者反饋
書(shū)目名稱Auger- and X-Ray Photoelectron Spectroscopy in Materials Science讀者反饋學(xué)科排名
作者: 有危險(xiǎn) 時(shí)間: 2025-3-22 00:19
Springer Series in Surface Scienceshttp://image.papertrans.cn/b/image/165498.jpg作者: restrain 時(shí)間: 2025-3-22 04:28 作者: BROW 時(shí)間: 2025-3-22 05:02 作者: BRIDE 時(shí)間: 2025-3-22 10:28 作者: GNAW 時(shí)間: 2025-3-22 14:39
https://doi.org/10.1007/978-3-662-52893-8ile the ultimate limit is given by the properties of the respective instrument, its optimum settings can be chosen by the analyst within those limits. Besides primary excitation energy and power (current), the most important other parameters which can be varied and optimized by the analyst are set b作者: rheumatology 時(shí)間: 2025-3-22 20:50
Generic and Indexed Programming-to-noise (. ∕ .) ratio. For a given analytical task, the art of the analyst is to find the appropriate, optimum signal-to-noise (. ∕ .) ratio within instrumental limits. Because of its importance and dependence on many parameters in AES and XPS, the . ∕ . ratio is considered in detail in the follow作者: 全神貫注于 時(shí)間: 2025-3-23 00:37 作者: FECK 時(shí)間: 2025-3-23 04:19 作者: prostatitis 時(shí)間: 2025-3-23 06:24 作者: CLOT 時(shí)間: 2025-3-23 13:04
Simeon Reich,Alexander J. Zaslavski topography, or electronic states. The considerable refinement of measurement techniques in the past three decades, all these characteristics of surfaces and interfaces can be analyzed using an abundant variety of methods. All of the methods used for surface studies (together with method variants pr作者: acrobat 時(shí)間: 2025-3-23 17:41 作者: 打包 時(shí)間: 2025-3-23 18:06 作者: facetious 時(shí)間: 2025-3-24 02:13
https://doi.org/10.1007/978-3-642-30365-4Electron spectroscopy is based on the element-specific binding energy of electrons in the atomic shell and their determination by electron spectrometers.作者: CLOWN 時(shí)間: 2025-3-24 02:43
Qualitative Analysis (Principle and Spectral Interpretation),Electron spectroscopy is based on the element-specific binding energy of electrons in the atomic shell and their determination by electron spectrometers.作者: 牙齒 時(shí)間: 2025-3-24 09:40 作者: OWL 時(shí)間: 2025-3-24 12:03 作者: somnambulism 時(shí)間: 2025-3-24 15:27 作者: CRUMB 時(shí)間: 2025-3-24 22:34 作者: 歌劇等 時(shí)間: 2025-3-24 23:09 作者: incarcerate 時(shí)間: 2025-3-25 04:35
Introduction and Outline,easy elemental identification and the detection of chemical bonds, and they are principally nondestructive. Furthermore, particularly in AES, an outstanding spatial resolution and, in XPS, a high energy-resolution enable mapping of elements and of chemical states. AES and XPS can be easily combined 作者: 最初 時(shí)間: 2025-3-25 10:42 作者: 旅行路線 時(shí)間: 2025-3-25 12:13
0931-5195 ayer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review diff978-3-642-43173-9978-3-642-27381-0Series ISSN 0931-5195 Series E-ISSN 2198-4743 作者: 相互影響 時(shí)間: 2025-3-25 16:19 作者: 陰謀小團(tuán)體 時(shí)間: 2025-3-25 20:40 作者: 散布 時(shí)間: 2025-3-26 01:25
https://doi.org/10.1007/978-3-662-52893-8In this way, the angle of incidence of the primary photons or electrons and the angle of emission of Auger- or photoelectrons can be varied (Sects. 5.1 and 5.2). This variation cannot only be used to find optimum signal intensity but also to provide nondestructive depth profiles by angle-resolved XPS (AR-XPS) and AES (AR-AES) (see Sect. 7.2.1).作者: crease 時(shí)間: 2025-3-26 05:50
Generic Programming with Dependent Types,ious distortions). Because of their relatively moderate matrix effects, AES and XPS in combination with argon ion bombardment have become the most popular tool for depth profiling of major components in thin films, with a clear preference of AES depth profiling as explained in Sect. 7.1.6.作者: engagement 時(shí)間: 2025-3-26 10:31
Quantitative Analysis (Data Evaluation), for AES, quantification of intensities in terms of atomic concentrations is only possible by knowledge of the in-depth distribution of composition, with the limiting cases of homogeneous distribution and of thin atomic layer(s) on a substrate.作者: palpitate 時(shí)間: 2025-3-26 13:03
Optimizing Measured Signal Intensity: Emission Angle, Incidence Angle and Surface Roughness,In this way, the angle of incidence of the primary photons or electrons and the angle of emission of Auger- or photoelectrons can be varied (Sects. 5.1 and 5.2). This variation cannot only be used to find optimum signal intensity but also to provide nondestructive depth profiles by angle-resolved XPS (AR-XPS) and AES (AR-AES) (see Sect. 7.2.1).作者: 流逝 時(shí)間: 2025-3-26 18:36 作者: PUT 時(shí)間: 2025-3-26 22:27 作者: 創(chuàng)新 時(shí)間: 2025-3-27 01:12 作者: Popcorn 時(shí)間: 2025-3-27 06:32
https://doi.org/10.1007/978-3-642-15450-8th a precise identification of the problem and clarification of the question whether the task and the sample are compatible with surface analysis, and which result can be principally expected from the analytical study. Therefore, an analytical strategy is required.作者: Confidential 時(shí)間: 2025-3-27 12:39 作者: Clinch 時(shí)間: 2025-3-27 16:53 作者: 一大群 時(shí)間: 2025-3-27 18:04 作者: 群居男女 時(shí)間: 2025-3-28 00:34
Practice of Surface and Interface Analysis with AES and XPS,th a precise identification of the problem and clarification of the question whether the task and the sample are compatible with surface analysis, and which result can be principally expected from the analytical study. Therefore, an analytical strategy is required.作者: 缺乏 時(shí)間: 2025-3-28 04:48 作者: BILE 時(shí)間: 2025-3-28 06:34
Surface Analysis Techniques Related to AES and XPS,ces and interfaces can be analyzed using an abundant variety of methods. All of the methods used for surface studies (together with method variants probably more than 50) cannot be comprehensively treated here.作者: 共和國(guó) 時(shí)間: 2025-3-28 13:51
Introduction and Outline,perties of materials. For example, corrosion and oxidation, intergranular brittle fracture, wear and friction, and electronic properties strongly depend on surface and interfacial microchemistry [1.1]. Therefore, there was a growing demand for analysis on the atomic layer scale. This fact enhanced t作者: FELON 時(shí)間: 2025-3-28 15:30
Instrumentation, section of a typical XPS instrument and Fig.2.1b that of a typical AES spectrometer. The main parts are (1) the specimen on a sample holder with . movement stage, (2) an excitation source (X-ray source for XPS, electron gun for AES), (3) the electron energy analyzer with detector, and (4) an auxili作者: 冒煙 時(shí)間: 2025-3-28 22:00
Quantitative Analysis (Data Evaluation), a measured spectrum. Mainly depending on the tolerable uncertainty in the respective analytical task, the signal intensity is obtained by application of more or less elaborate procedures to the raw data, as outlined in the next paragraph (Sect.4.1). Section 4.2 presents the basic tools for quantifi作者: 審問(wèn),審訊 時(shí)間: 2025-3-28 23:24 作者: Cupidity 時(shí)間: 2025-3-29 04:25
