標題: Titlebook: Analytical Electron Microscopy for Materials Science; Daisuke Shindo,Tetsuo Oikawa Book 2002 Springer Japan 2002 Inelastic scattering.adva [打印本頁] 作者: ACRO 時間: 2025-3-21 17:44
書目名稱Analytical Electron Microscopy for Materials Science影響因子(影響力)
書目名稱Analytical Electron Microscopy for Materials Science影響因子(影響力)學科排名
書目名稱Analytical Electron Microscopy for Materials Science網(wǎng)絡(luò)公開度
書目名稱Analytical Electron Microscopy for Materials Science網(wǎng)絡(luò)公開度學科排名
書目名稱Analytical Electron Microscopy for Materials Science被引頻次
書目名稱Analytical Electron Microscopy for Materials Science被引頻次學科排名
書目名稱Analytical Electron Microscopy for Materials Science年度引用
書目名稱Analytical Electron Microscopy for Materials Science年度引用學科排名
書目名稱Analytical Electron Microscopy for Materials Science讀者反饋
書目名稱Analytical Electron Microscopy for Materials Science讀者反饋學科排名
作者: sacrum 時間: 2025-3-21 21:31
Daisuke Shindo,Tetsuo OikawaDetailed explanation of the basic principles and the latest improvements in analytical electron microscopy.Generous illustrations and experimental data作者: 倫理學 時間: 2025-3-22 00:48
http://image.papertrans.cn/a/image/156599.jpg作者: 演講 時間: 2025-3-22 06:41 作者: 切割 時間: 2025-3-22 11:10
Lecture Notes in Computer Sciencetroscopy (EDS). In the past, EELS was thought to be effective in compositional analysis only for light elements but useless in general for quantitative analysis in comparison with EDS. However, the accuracy of analysis by EELS is much improved recently owing to high performance of the detector and u作者: cliche 時間: 2025-3-22 13:45
Disinformation in Open Online Mediais chapter. Although some improvement in the resolution of EDS has been attempted, there has been no significant modification introduced in the practice and application of EDS in comparison with electron energyloss spectroscopy (EELS). Still, this method is the most standard and reliable one in the 作者: 邪惡的你 時間: 2025-3-22 20:52 作者: 控制 時間: 2025-3-22 22:58 作者: Sinus-Rhythm 時間: 2025-3-23 03:17
Basic Principles of Analytical Electron Microscopy,Before going into a detailed explanation of the hardware of transmission electron microscopes and analytical methods, it is necessary to understand some fundamental aspects. These areas include the interactions between incident electrons and materials, the basic principles of analytical electron microscopy, and the processing of analytical data.作者: 圖表證明 時間: 2025-3-23 06:42 作者: 果仁 時間: 2025-3-23 13:44
Electron Energy-Loss Spectroscopy,sage of a FEG. Furthermore, an energy-filter system that provides energy-filtered images has been installed on an electron microscope. Thus, currently EELS has attracted much attention for new applications such as elemental mapping and background subtraction in electron diffraction patterns.作者: Indebted 時間: 2025-3-23 16:09
Book 2002of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analyt作者: exclamation 時間: 2025-3-23 20:18
Book 2002of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.作者: 固定某物 時間: 2025-3-24 01:10 作者: 明確 時間: 2025-3-24 06:15
Peripheral Instruments and Techniques for Analytical Electron Microscopy,ction is explained in the literature [1-3]. In this chapter we discuss the principles and application of nano-beam electron diffraction and convergent beam electron diffraction, which extensively utilize the function of an analytical electron microscope.作者: Mendicant 時間: 2025-3-24 08:53 作者: 不適當 時間: 2025-3-24 10:45 作者: CANE 時間: 2025-3-24 16:42 作者: 最低點 時間: 2025-3-24 22:59 作者: VALID 時間: 2025-3-24 23:15
Lecture Notes in Computer Sciencesage of a FEG. Furthermore, an energy-filter system that provides energy-filtered images has been installed on an electron microscope. Thus, currently EELS has attracted much attention for new applications such as elemental mapping and background subtraction in electron diffraction patterns.作者: 乳汁 時間: 2025-3-25 05:58 作者: 憤慨一下 時間: 2025-3-25 08:12
Analytical Electron Microscopy for Materials Science作者: 發(fā)酵劑 時間: 2025-3-25 12:48
Analytical Electron Microscopy for Materials Science978-4-431-66988-3作者: 飾帶 時間: 2025-3-25 18:19
Constitution and Basic Operation of Analytical Electron Microscopes,es and diffraction patterns and for carrying out various extensive analyses, it is important to set an analytical electron microscope to be in optimal operating condition by learning the principles of its constituent units and its appropriate operating method. Here, the basic configuration of a tran作者: 和藹 時間: 2025-3-25 22:39
Electron Energy-Loss Spectroscopy,troscopy (EDS). In the past, EELS was thought to be effective in compositional analysis only for light elements but useless in general for quantitative analysis in comparison with EDS. However, the accuracy of analysis by EELS is much improved recently owing to high performance of the detector and u作者: Foreshadow 時間: 2025-3-26 04:08
Energy Dispersive X-ray Spectroscopy,is chapter. Although some improvement in the resolution of EDS has been attempted, there has been no significant modification introduced in the practice and application of EDS in comparison with electron energyloss spectroscopy (EELS). Still, this method is the most standard and reliable one in the 作者: SPALL 時間: 2025-3-26 04:21 作者: seroma 時間: 2025-3-26 08:27 作者: 跳動 時間: 2025-3-26 13:15 作者: 雄辯 時間: 2025-3-26 17:06 作者: 爭吵 時間: 2025-3-27 00:16 作者: Infect 時間: 2025-3-27 02:07
roduzierender Transportunternehmen voraus, sondern auch ein optimales Angebot an komplement?ren Infrastrukturleistungen (vgl. Cornelius/Pf?hler (1993), S. 183). ?Auf liberalisierten Transportm?rkten kommt dem ungehinderten Zugang konkurrierender Anbieter zu knappen und nur zu sehr hohen Kosten dupli作者: 字形刻痕 時間: 2025-3-27 05:18 作者: lesion 時間: 2025-3-27 13:18 作者: 婚姻生活 時間: 2025-3-27 15:55 作者: Blasphemy 時間: 2025-3-27 21:05
Comparing Mass Media in Established Democracies978-1-137-39138-4Series ISSN 2946-3416 Series E-ISSN 2946-3424
