標(biāo)題: Titlebook: Analog and Mixed-Signal Boundary-Scan; A Guide to the IEEE Adam Osseiran Book 1999 Springer Science+Business Media Dordrecht 1999 Signal.S [打印本頁] 作者: Entangle 時(shí)間: 2025-3-21 17:31
書目名稱Analog and Mixed-Signal Boundary-Scan影響因子(影響力)
書目名稱Analog and Mixed-Signal Boundary-Scan影響因子(影響力)學(xué)科排名
書目名稱Analog and Mixed-Signal Boundary-Scan網(wǎng)絡(luò)公開度
書目名稱Analog and Mixed-Signal Boundary-Scan網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Analog and Mixed-Signal Boundary-Scan被引頻次
書目名稱Analog and Mixed-Signal Boundary-Scan被引頻次學(xué)科排名
書目名稱Analog and Mixed-Signal Boundary-Scan年度引用
書目名稱Analog and Mixed-Signal Boundary-Scan年度引用學(xué)科排名
書目名稱Analog and Mixed-Signal Boundary-Scan讀者反饋
書目名稱Analog and Mixed-Signal Boundary-Scan讀者反饋學(xué)科排名
作者: Cougar 時(shí)間: 2025-3-21 20:37 作者: 砍伐 時(shí)間: 2025-3-22 03:04
Introduction to the IEEE 1149.4, (the interconnect) on which separately manufactured components are mounted so that the component pins make electrical contact with the interconnect. In normal functional operation, the PCA connects to other parts of the system by way of a set of contacts such as the edge-connector shown in Figure 1作者: gorgeous 時(shí)間: 2025-3-22 05:01 作者: Amenable 時(shí)間: 2025-3-22 10:40
IEEE 1149.4 Architecture and Instruction Set, because they are more familiar with analog and mixed-signal ICs, which typically do not use boundary-scan. Also, these instruction and architecture descriptions should be read in addition to, and not instead of, the 1149.4 Standard itself. The instruction description here is intended to be more con作者: opalescence 時(shí)間: 2025-3-22 13:38
Peripheral Cell Design for IEEE 1149.4,terization. The main cost for a mixed signal design is the addition of some switches and their associated parasitics. This chapter describes how an integrated circuit designer can add those switches, or the functional equivalent, without compromising performance.作者: Interlocking 時(shí)間: 2025-3-22 17:23 作者: Aggressive 時(shí)間: 2025-3-22 23:37 作者: CRACK 時(shí)間: 2025-3-23 02:43 作者: Limpid 時(shí)間: 2025-3-23 07:15 作者: PSA-velocity 時(shí)間: 2025-3-23 10:33 作者: 百靈鳥 時(shí)間: 2025-3-23 17:02
IEEE 1149.4 Architecture and Instruction Set,escriptions should be read in addition to, and not instead of, the 1149.4 Standard itself. The instruction description here is intended to be more concise than that in the 1149.4 document so that readers can easily comprehend the full instruction suite without needing to understand every detail.作者: 喧鬧 時(shí)間: 2025-3-23 20:50 作者: 朋黨派系 時(shí)間: 2025-3-24 00:42
Frontiers in Electronic Testinghttp://image.papertrans.cn/a/image/155870.jpg作者: 驚呼 時(shí)間: 2025-3-24 05:44
Introduction to the IEEE 1149.4, (the interconnect) on which separately manufactured components are mounted so that the component pins make electrical contact with the interconnect. In normal functional operation, the PCA connects to other parts of the system by way of a set of contacts such as the edge-connector shown in Figure 1.1.作者: 豎琴 時(shí)間: 2025-3-24 08:32 作者: pineal-gland 時(shí)間: 2025-3-24 13:49 作者: muffler 時(shí)間: 2025-3-24 17:50
Undergraduate Texts in MathematicsThis chapter discusses applications of the IEEE 1149.4 Mixed-signal Test Bus Standard in system testing, chip design, and in-situ measurement. The reader is assumed to:作者: considerable 時(shí)間: 2025-3-24 19:02 作者: 我要沮喪 時(shí)間: 2025-3-25 02:23
Analog and Mixed-Signal Boundary-Scan978-1-4757-4499-6Series ISSN 0929-1296 作者: blithe 時(shí)間: 2025-3-25 03:25 作者: Carcinogenesis 時(shí)間: 2025-3-25 08:07 作者: 放縱 時(shí)間: 2025-3-25 15:23 作者: Simulate 時(shí)間: 2025-3-25 16:11
https://doi.org/10.1007/978-1-4757-4499-6Signal; Standard; analog; complexity; integrated circuit; manufacturing; testing作者: 膽汁 時(shí)間: 2025-3-25 23:54
978-1-4419-5115-1Springer Science+Business Media Dordrecht 1999作者: 賠償 時(shí)間: 2025-3-26 01:31
Basic Concepts of Difference Algebra, (the interconnect) on which separately manufactured components are mounted so that the component pins make electrical contact with the interconnect. In normal functional operation, the PCA connects to other parts of the system by way of a set of contacts such as the edge-connector shown in Figure 1作者: 有權(quán) 時(shí)間: 2025-3-26 07:08
Systems of Algebraic Difference Equations,standard was developed as a solution to two continuing trends that are having a significant, adverse, impact on the task of testing loaded printed wiring boards: increasing chip complexity and greater miniaturization. The former increases the difficulty of test generation, while the latter impedes a作者: 發(fā)誓放棄 時(shí)間: 2025-3-26 11:09 作者: delusion 時(shí)間: 2025-3-26 16:40 作者: Corral 時(shí)間: 2025-3-26 18:44 作者: SOW 時(shí)間: 2025-3-26 22:09
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10樓作者: 完成 時(shí)間: 2025-3-28 08:46
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