標(biāo)題: Titlebook: Ageing of Integrated Circuits; Causes, Effects and Basel Halak Book 2020 Springer Nature Switzerland AG 2020 Analog IC Reliability.Aging E [打印本頁] 作者: whiplash 時間: 2025-3-21 19:56
書目名稱Ageing of Integrated Circuits影響因子(影響力)
書目名稱Ageing of Integrated Circuits影響因子(影響力)學(xué)科排名
書目名稱Ageing of Integrated Circuits網(wǎng)絡(luò)公開度
書目名稱Ageing of Integrated Circuits網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Ageing of Integrated Circuits被引頻次
書目名稱Ageing of Integrated Circuits被引頻次學(xué)科排名
書目名稱Ageing of Integrated Circuits年度引用
書目名稱Ageing of Integrated Circuits年度引用學(xué)科排名
書目名稱Ageing of Integrated Circuits讀者反饋
書目名稱Ageing of Integrated Circuits讀者反饋學(xué)科排名
作者: 大量殺死 時間: 2025-3-21 21:16 作者: Intrepid 時間: 2025-3-22 03:44
Critique and Its Postnational Aftermath The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error作者: Lobotomy 時間: 2025-3-22 08:02 作者: linear 時間: 2025-3-22 10:18 作者: GLIDE 時間: 2025-3-22 15:49 作者: 模仿 時間: 2025-3-22 17:46 作者: ciliary-body 時間: 2025-3-23 00:15
Ageing Mitigation Techniques for SRAM Memories The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error作者: puzzle 時間: 2025-3-23 03:24 作者: 故意釣到白楊 時間: 2025-3-23 06:52 作者: 平靜生活 時間: 2025-3-23 12:23
On-Chip Ageing Monitoring and System Adaptation compensation. Voltage and frequency scaling techniques are combined with monitors to ensure fault-free operation. Measurements and simulations were performed on large sample sets for varied range of process, voltages, temperatures and ageing to argument on the choice of paths to be monitored and to illustrate adaptive compensation techniques.作者: Petechiae 時間: 2025-3-23 15:12 作者: antedate 時間: 2025-3-23 19:47
Aging Mitigation Techniques for Microprocessors Using Anti-aging Softwares of the critical path into a relaxed (balanced) mode. The results show that the lifetime of the system can be extended by applying balanced stress patterns at a higher level of abstraction and during the idle time of a processor system.作者: 大方一點 時間: 2025-3-23 22:52 作者: 厚顏 時間: 2025-3-24 03:24 作者: SUGAR 時間: 2025-3-24 07:48 作者: 天真 時間: 2025-3-24 14:07
Ageing-Aware Logic Synthesisinto logic synthesis. This chapter presents case studies about how state-of-the-art techniques can be used to enhance BTI lifetime reliability during synthesis and discusses the advantages and drawbacks of each type of methods.作者: HPA533 時間: 2025-3-24 15:22 作者: vector 時間: 2025-3-24 19:26 作者: 礦石 時間: 2025-3-25 01:56 作者: monologue 時間: 2025-3-25 04:16 作者: Deduct 時間: 2025-3-25 08:42
Ageing Mitigation Techniques for SRAM Memoriesents of digital circuits is crucial, in particular, in static random-access memory (SRAM) as it is always subject to ageing for whatever value is stored in an SRAM cell. Moreover, the prolonged storage of the same bit patterns in an SRAM can cause asymmetric NBTI stress, which is manifested by the t作者: 障礙 時間: 2025-3-25 12:28
Ageing-Aware Logic SynthesisI effect increases signal delays, eventually leading to timing violations. Due to the increased demand for circuit density, logic synthesis is currently a significant EDA process to design a circuit with many millions of transistors. Traditional synthesis process does not specifically consider the a作者: faddish 時間: 2025-3-25 19:39
On-Chip Ageing Monitoring and System Adaptationand performance monitors have become necessary for adaptive compensation schemes. This chapter presents up-to-date state-of-the-art performance and reliability monitors, insertion methodology and experimental results of different monitors used for process and environment variations as well as ageing作者: 記憶法 時間: 2025-3-25 22:03
Aging Monitors for SRAM Memory Cells and Sense Amplifierso various aging mechanisms. Bias temperature instability (BTI) and hot carrier injection (HCI) phenomena are highly accused of the aging-related reliability reduction. This degradation is getting worse under excess stress conditions (high operating temperature and voltage levels). Aging phenomena si作者: Lasting 時間: 2025-3-26 02:51
A Cost-Efficient Aging Sensor Based on Multiple Paths Delay Fault MonitoringS device will degrade significantly over time and, therefore, results in the delay faults. In situ delay fault monitoring schemes have been proposed to ensure the reliability of an IC during its lifetime. Such schemes are usually based on the application of ageing sensors to predict ageing-induced f作者: conscribe 時間: 2025-3-26 04:45 作者: inflame 時間: 2025-3-26 10:01
https://doi.org/10.1007/978-3-030-23781-3Analog IC Reliability; Aging Effects on Integrated Circuits; Aging-effects Mitigation in processor arc作者: expire 時間: 2025-3-26 14:44
978-3-030-23783-7Springer Nature Switzerland AG 2020作者: 彈藥 時間: 2025-3-26 17:01
yasser elhariry,Edwige Tamalet Talbayevts the unwanted but unavoidable oxide defects leading to charge traps and presents activation mechanisms. These defects can lead to a variety of known ageing effects, such as negative/positive bias instability, hot carrier degradation (alias hot carrier injection), random telegraph noise and time-de作者: 鋼筆尖 時間: 2025-3-26 23:32 作者: 清醒 時間: 2025-3-27 05:00 作者: 惡意 時間: 2025-3-27 08:37
Critique and Its Postnational Aftermathents of digital circuits is crucial, in particular, in static random-access memory (SRAM) as it is always subject to ageing for whatever value is stored in an SRAM cell. Moreover, the prolonged storage of the same bit patterns in an SRAM can cause asymmetric NBTI stress, which is manifested by the t作者: 護(hù)航艦 時間: 2025-3-27 13:05 作者: optional 時間: 2025-3-27 15:27
Philipp S. Müller,Markus Ledererand performance monitors have become necessary for adaptive compensation schemes. This chapter presents up-to-date state-of-the-art performance and reliability monitors, insertion methodology and experimental results of different monitors used for process and environment variations as well as ageing作者: A簡潔的 時間: 2025-3-27 19:32
https://doi.org/10.1057/9781403979513o various aging mechanisms. Bias temperature instability (BTI) and hot carrier injection (HCI) phenomena are highly accused of the aging-related reliability reduction. This degradation is getting worse under excess stress conditions (high operating temperature and voltage levels). Aging phenomena si作者: Dignant 時間: 2025-3-28 00:16
Gene Callahan,Kenneth B. McIntyreS device will degrade significantly over time and, therefore, results in the delay faults. In situ delay fault monitoring schemes have been proposed to ensure the reliability of an IC during its lifetime. Such schemes are usually based on the application of ageing sensors to predict ageing-induced f作者: BYRE 時間: 2025-3-28 02:11
Basel HalakDescribes in detail the physical mechanisms of CMOS ageing.Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits.Presents state-of-the art s作者: 山羊 時間: 2025-3-28 08:41
http://image.papertrans.cn/a/image/151049.jpg作者: hyperuricemia 時間: 2025-3-28 11:03 作者: 注意到 時間: 2025-3-28 15:15 作者: 聚集 時間: 2025-3-28 22:28
