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標(biāo)題: SCIE期刊IEEE Design & Test 2024/2025影響因子:1.909 (IEEE DES TEST) (2168-2356). (ENGINEERING, ELECTRICAL & ELECTRONIC)(工程，電氣和 [打印本頁(yè)]

作者: 貪污 時(shí)間: 2025-3-21 16:19
SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)影響因子@(工程，電氣和電子)學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)總引論文

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)總引論文@(工程，電氣和電子)學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)總引頻次@(工程，電氣和電子)學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)即時(shí)影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)即時(shí)影響因子@(工程，電氣和電子)學(xué)科排名

SCIE(SCI)期刊IEEE Design & Test(20 21 REV HIST)五年累積影響因子

SCIE(SCI)期刊IEEE Design & Test(IEEE DES TEST)五年累積影響因子@(工程，電氣和電子)學(xué)科排名

作者: 使熄滅 時(shí)間: 2025-3-21 20:41

作者: COMA 時(shí)間: 2025-3-22 03:17

作者: inquisitive 時(shí)間: 2025-3-22 05:38
Submitted on: 11 November 2021. Revised on: 03 March 2022. Accepted on: 19 March 2022. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: Exonerate 時(shí)間: 2025-3-22 10:25

作者: 蒸發(fā) 時(shí)間: 2025-3-22 14:52
Submitted on: 05 January 2003. Revised on: 07 April 2003. Accepted on: 30 April 2003. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 禁止,切斷 時(shí)間: 2025-3-22 20:43

作者: Abrade 時(shí)間: 2025-3-22 22:19
Submitted on: 01 January 2003. Revised on: 30 April 2003. Accepted on: 07 June 2003. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: APRON 時(shí)間: 2025-3-23 04:20

作者: 漸強(qiáng) 時(shí)間: 2025-3-23 06:21
Submitted on: 18 July 2016. Revised on: 25 August 2016. Accepted on: 06 September 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: PAGAN 時(shí)間: 2025-3-23 11:01

作者: Indigence 時(shí)間: 2025-3-23 17:40
Submitted on: 30 August 2010. Revised on: 24 October 2010. Accepted on: 20 November 2010. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 挫敗 時(shí)間: 2025-3-23 21:33
Submitted on: 02 January 2004. Revised on: 15 February 2004. Accepted on: 05 March 2004. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: Original 時(shí)間: 2025-3-24 00:37
Submitted on: 03 January 2014. Revised on: 16 February 2014. Accepted on: 01 March 2014. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: DAUNT 時(shí)間: 2025-3-24 06:19

作者: 動(dòng)物 時(shí)間: 2025-3-24 08:18
Submitted on: 25 July 2000. Revised on: 07 November 2000. Accepted on: 17 December 2000. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 禍害隱伏 時(shí)間: 2025-3-24 10:55
Submitted on: 23 November 2021. Revised on: 15 March 2022. Accepted on: 23 April 2022. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 卷發(fā) 時(shí)間: 2025-3-24 18:50
Submitted on: 17 February 2016. Revised on: 16 May 2016. Accepted on: 26 June 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: 陳舊 時(shí)間: 2025-3-24 19:18

作者: engagement 時(shí)間: 2025-3-25 01:53

作者: 可耕種 時(shí)間: 2025-3-25 06:19

作者: 變化無(wú)常 時(shí)間: 2025-3-25 09:54

作者: DNR215 時(shí)間: 2025-3-25 15:13

作者: 慢慢流出 時(shí)間: 2025-3-25 19:50
Submitted on: 06 February 2024. Revised on: 01 March 2024. Accepted on: 02 April 2024. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: circuit 時(shí)間: 2025-3-25 23:25

作者: GUILT 時(shí)間: 2025-3-26 01:20

作者: 革新 時(shí)間: 2025-3-26 06:21
Submitted on: 06 September 2005. Revised on: 01 November 2005. Accepted on: 23 December 2005. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: DENT 時(shí)間: 2025-3-26 10:29

作者: Trochlea 時(shí)間: 2025-3-26 16:05

作者: 得罪人 時(shí)間: 2025-3-26 16:53
Submitted on: 24 February 2016. Revised on: 24 April 2016. Accepted on: 02 June 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: Spina-Bifida 時(shí)間: 2025-3-26 21:22

作者: Consequence 時(shí)間: 2025-3-27 04:21
Submitted on: 13 January 2016. Revised on: 10 April 2016. Accepted on: 12 May 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: Blood-Vessels 時(shí)間: 2025-3-27 07:27

作者: 悠然 時(shí)間: 2025-3-27 12:36
Submitted on: 23 July 2022. Revised on: 24 October 2022. Accepted on: 21 November 2022. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

作者: Dysplasia 時(shí)間: 2025-3-27 13:52

作者: 蒸發(fā) 時(shí)間: 2025-3-27 20:24

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